An Improved Negative Transient Voltage Noise Immunity for an HVIC using Self-shielding Structure
Jonishi, Akihiro, Yamaji, Masaharu, Tanaka, Takahide, Sumida, Hitoshi
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30.05.2021)
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30.05.2021)
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