Crystallographic defects under device-killing surface faults in a homoepitaxially grown film of SiC
Okada, Tatsuya, Kimoto, Tsunenobu, Yamai, Keita, Matsunami, Hiroyuki, Inoko, Fukuji
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (25.11.2003)
Published in Materials science & engineering. A, Structural materials : properties, microstructure and processing (25.11.2003)
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