Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design
Khandelwal, Sourabh, Yadav, Chandan, Agnihotri, Shantanu, Chauhan, Yogesh Singh, Curutchet, Arnaud, Zimmer, Thomas, De Jaeger, Jean-Claude, Defrance, Nicolas, Fjeldly, Tor A.
Published in IEEE transactions on electron devices (01.10.2013)
Published in IEEE transactions on electron devices (01.10.2013)
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Journal Article
Thermally Deposited Sb2Se3/CdS-Based Solar Cell: Experimental and Theoretical Analysis
Mamta, Kumari, Raman, Yadav, Chandan, Kumar, Rahul, Maurya, Kamlesh Kumar, Singh, Vidya Nand
Published in Nanomaterials (Basel, Switzerland) (22.03.2023)
Published in Nanomaterials (Basel, Switzerland) (22.03.2023)
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Journal Article
THz Characterization and Modeling of SiGe HBTs: Review (Invited)
Fregonese, Sebastien, Deng, Marina, Cabbia, Marco, Yadav, Chandan, De Matos, Magali, Zimmer, Thomas
Published in IEEE journal of the Electron Devices Society (01.01.2020)
Published in IEEE journal of the Electron Devices Society (01.01.2020)
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Journal Article
Compact Modeling of Multi-Layered MoS2 FETs Including Negative Capacitance Effect
Nandan, Keshari, Yadav, Chandan, Rastogi, Priyank, Toral-Lopez, Alejandro, Marin-Sanchez, Antonio, Marin, Enrique G., Ruiz, Francisco G., Bhowmick, Somnath, Chauhan, Yogesh S.
Published in IEEE journal of the Electron Devices Society (2020)
Published in IEEE journal of the Electron Devices Society (2020)
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Journal Article
Analysis of Quantum Capacitance Effect in Ultra-Thin-Body III-V Transistor
Yadav, Chandan, Agarwal, Amit, Chauhan, Yogesh Singh
Published in 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) (01.01.2016)
Published in 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) (01.01.2016)
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Conference Proceeding
Journal Article
Analytical Modeling and Experimental Validation of Threshold Voltage in BSIM6 MOSFET Model
Agarwal, Harshit, Gupta, Chetan, Kushwaha, Pragya, Yadav, Chandan, Duarte, Juan P., Khandelwal, Sourabh, Chenming Hu, Chauhan, Yogesh S.
Published in IEEE journal of the Electron Devices Society (01.05.2015)
Published in IEEE journal of the Electron Devices Society (01.05.2015)
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Journal Article