Demystifying data evaluation in the measurement of periodic structures
Nečas, D, Yacoot, A, Valtr, M, Klapetek, P
Published in Measurement science & technology (01.05.2023)
Published in Measurement science & technology (01.05.2023)
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Journal Article
Algorithms for using silicon steps for scanning probe microscope evaluation
Garnæs, J, Ne as, D, Nielsen, L, H Madsen, M, Torras-Rosell, A, Zeng, G, Klapetek, P, Yacoot, A
Published in Metrologia (01.12.2020)
Published in Metrologia (01.12.2020)
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Journal Article
A heterodyne interferometer with periodic nonlinearities smaller than ±10 pm
Weichert, C, Köchert, P, Köning, R, Flügge, J, Andreas, B, Kuetgens, U, Yacoot, A
Published in Measurement science & technology (01.09.2012)
Published in Measurement science & technology (01.09.2012)
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Journal Article
MEMS displacement generator for atomic force microscopy metrology
Babij, M, Majstrzyk, W, Sierakowski, A, Janus, P, Grabiec, P, Ramotowski, Z, Yacoot, A, Gotszalk, T
Published in Measurement science & technology (01.06.2021)
Published in Measurement science & technology (01.06.2021)
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Journal Article
Phase calibration target for quantitative phase imaging with ptychography
Godden, T M, Muñiz-Piniella, A, Claverley, J D, Yacoot, A, Humphry, M J
Published in Optics express (04.04.2016)
Published in Optics express (04.04.2016)
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Journal Article
'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups
Russell-Pavier, F S, Picco, L, Day, J C C, Shatil, N R, Yacoot, A, Payton, O D
Published in Measurement science & technology (01.10.2018)
Published in Measurement science & technology (01.10.2018)
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Journal Article
Advances in Scanning Force Microscopy for Dimensional Metrology
Danzebrink, H.-U., Koenders, L., Wilkening, G., Yacoot, A., Kunzmann, H.
Published in CIRP annals (2006)
Published in CIRP annals (2006)
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Journal Article
Conference Proceeding
Large area high-speed metrology SPM system
Klapetek, P, Valtr, M, Picco, L, Payton, O D, Martinek, J, Yacoot, A, Miles, M
Published in Nanotechnology (13.02.2015)
Published in Nanotechnology (13.02.2015)
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Journal Article
Methods for determining and processing 3D errors and uncertainties for AFM data analysis
Klapetek, P, Nečas, D, Campbellová, A, Yacoot, A, Koenders, L
Published in Measurement science & technology (01.02.2011)
Published in Measurement science & technology (01.02.2011)
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Journal Article
A review of recent work in sub-nanometre displacement measurement using optical and X–ray interferometry
Peggs, G. N., Yacoot, A.
Published in Philosophical transactions of the Royal Society of London. Series A: Mathematical, physical, and engineering sciences (15.05.2002)
Published in Philosophical transactions of the Royal Society of London. Series A: Mathematical, physical, and engineering sciences (15.05.2002)
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Journal Article
Advances in traceable nanometrology at the National Physical Laboratory
Leach, Richard, Haycocks, Jane, Jackson, Keith, Lewis, Andrew, Oldfield, Simon, Yacoot, Andrew
Published in Nanotechnology (01.03.2001)
Published in Nanotechnology (01.03.2001)
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Journal Article
Optical track width measurements below 100 nm using artificial neural networks
Smith, R J, See, C W, Somekh, M G, Yacoot, A, Choi, E
Published in Measurement science & technology (01.12.2005)
Published in Measurement science & technology (01.12.2005)
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Journal Article
Twinning in Natural Diamond. I. Contact Twins
Yacoot, A., Moore, Moreton, Machado, W. G.
Published in Journal of applied crystallography (01.10.1998)
Published in Journal of applied crystallography (01.10.1998)
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Journal Article
Twinning in Natural Diamond. II. Interpenetrant Cubes
Machado, W. G., Moore, Moreton, Yacoot, A.
Published in Journal of applied crystallography (01.10.1998)
Published in Journal of applied crystallography (01.10.1998)
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Journal Article
Error mapping of high-speed AFM systems
Klapetek, Petr, Picco, Loren, Payton, Oliver, Yacoot, Andrew, Miles, Mervyn
Published in Measurement science & technology (01.02.2013)
Published in Measurement science & technology (01.02.2013)
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Journal Article
A heterodyne interferometer with periodic nonlinearities smaller than plus or minus 10 pm
Weichert, C, Koechert, P, Koening, R, Fluegge, J, Andreas, B, Kuetgens, U, Yacoot, A
Published in Measurement science & technology (01.09.2012)
Published in Measurement science & technology (01.09.2012)
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Journal Article