by Fukuchi, T., Takeda, S., Katsuragawa, M., Yabu, G., Watanabe, S., Takahashi, T., Watanabe, Y.
Published in Journal of instrumentation (01.01.2023)

by Takeda, S., Umeda, I., Yagishita, A., Katsuragawa, M., Orita, T., Yabu, G., Tomaru, R., Takahashi, T., Moriyama, F., Sugawara, H., Watanabe, S., Mizuma, H., Ohnuki, K., Fujii, H., Furenlid, L. R., Kanayama, Y., Nambu, A., Yin, X., Haba, H.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)

by Fukuchi, T., Takeda, S., Katsuragawa, M., Yabu, G., Watanabe, S., Takahashi, T., Watanabe, Y.
Published in Journal of instrumentation (01.01.2023)