X-ray diffractometer with multilayer reflection-type monochromator
Verman, Boris, Platonov, Yuriy, Osakabe, Takeshi, Jiang, Licai, Omote, Kazuhiko, Ozawa, Tetsuya
Year of Publication 08.10.2019
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Year of Publication 08.10.2019
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TWI827060B
OMOTE, KAZUHIKO, JIANG, LICAI, FUJIMURA, HAJIME, TADA, TSUTOMU, HIGUCHI, TOSHIFUMI, VERMAN, BORIS, KAMBE, MAKOTO, PLATONOV, YURIY, NONOGUCHI, MASAHIRO
Year of Publication 21.12.2023
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Year of Publication 21.12.2023
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Total reflection fluorescent X-ray analysis device having high analysis sensitivity and high analysis speed
OMOTE, KAZUHIKO, JIANG, LICAI, FUJIMURA, HAJIME, TADA, TSUTOMU, HIGUCHI, TOSHIFUMI, VERMAN, BORIS, KAMBE, MAKOTO, PLATONOV, YURIY, NONOGUCHI, MASAHIRO
Year of Publication 01.12.2023
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Year of Publication 01.12.2023
Patent
X-RAY DIFFRACTOMETER
OSAKABE, Takeshi, VERMAN, Boris, JIANG, Licai, OMOTE, Kazuhiko, PLATONOV, Yuriy, OZAWA, Tetsuya
Year of Publication 20.12.2017
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Year of Publication 20.12.2017
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Total reflection X-ray fluorescence analyzer
KAMBE RYO, OMOTE KAZUHIKO, FUJIMURA HAJIME, PLATONOV YURIY, NONOGUCHI MASAHIRO, VERMAN BORIS, TADA TSUTOMU, JIANG LICAI, HIGUCHI TOSHIFUMI
Year of Publication 10.10.2023
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Year of Publication 10.10.2023
Patent
X-RAY DIFFRACTOMETER
OZAWA Tetsuya, PLATONOV Yuriy, OMOTE Kazuhiko, VERMAN Boris, OSAKABE Takeshi, JIANG Licai
Year of Publication 06.07.2017
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Year of Publication 06.07.2017
Patent
X-RAY DIFFRACTOMETER
OSAKABE, Takeshi, VERMAN, Boris, JIANG, Licai, OMOTE, Kazuhiko, PLATONOV, Yuriy, OZAWA, Tetsuya
Year of Publication 29.03.2017
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Year of Publication 29.03.2017
Patent