Soft error mechanism in SOI D flip-flop induced by space electrostatic discharge
Yuan, Run-Jie, Chen, Rui, Han, Jian-Wei, Wang, Xuan, Chen, Qian, Liang, Ya-Nan, Zhou, Jie
Published in Microelectronics and reliability (01.09.2022)
Published in Microelectronics and reliability (01.09.2022)
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激光激活异步累加器硬件木马研究
YUAN Run-Jie, ZHU, Xiang, Jian-Wei, HAN, LI, Yue, Ying-Qi, MA, Shi-Peng, SHANGGUAN, WANG, Tian, 袁润杰, 朱翔, 韩建伟, 李悦, 马英起, 上官士鹏, 王添
Published in Journal of Cryptologic Research (01.01.2022)
Published in Journal of Cryptologic Research (01.01.2022)
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