22nm FDSOI SRAM single event upset simulation analysis
Yuan, Jingshuang, Zhao, Yuanfu, Wang, Liang, Li, Tongde, Sui, Chenglong
Published in Journal of physics. Conference series (01.05.2021)
Published in Journal of physics. Conference series (01.05.2021)
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Journal Article
Effects of driving capability on single-event transient of inverter in bulk FinFET Technology
Bai, Yang, Yue, Suge, Sun, Yu, Zhu, Yongqin, Yuan, Jingshuang, Li, Tongde, Wang, Liang
Published in Journal of physics. Conference series (01.08.2024)
Published in Journal of physics. Conference series (01.08.2024)
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Journal Article
Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply Voltages
Li, Tongde, Zhao, Yuanfu, Wang, Liang, Shu, Lei, Zheng, Hongchao, Cao, Weiyi, Yuan, Jingshuang, Li, Junlin, Wang, Chenhui
Published in IEEE transactions on nuclear science (01.03.2022)
Published in IEEE transactions on nuclear science (01.03.2022)
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Journal Article
Research on High-Dose-Rate Transient Ionizing Radiation Effect in Nano-Scale FDSOI Flip-Flops
Li, Tongde, Yuan, Jingshuang, Bai, Yang, Yu, Chunqing, Gou, Chunliang, Shu, Lei, Wang, Liang, Zhao, Yuanfu
Published in Electronics (Basel) (01.07.2023)
Published in Electronics (Basel) (01.07.2023)
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Journal Article
Multi-bit flipping resistant latch circuit based on redundant structure
LIU ZHICHAO, LI TONGDE, WANG LIANG, WANG DAN, YUAN JINGSHUANG, ZHU YONGQIN
Year of Publication 02.07.2024
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Year of Publication 02.07.2024
Patent
Redundancy self-recovery latch capable of resisting single event upset of multiple nodes and clock signals
SUN YU, YU CHUNQING, ZHANG YANLONG, BAO YIHAO, LI TONGDE, WANG LIANG, WANG YAKUN, YUAN JINGSHUANG, DU QIAN, ZHU YONGQIN
Year of Publication 02.07.2024
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Year of Publication 02.07.2024
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Anti-radiation hardening flip-flop circuit capable of resisting single event transient and single event upset
LYU MAN, ZHANG YANLONG, LI TONGDE, WANG LIANG, WANG YAKUN, YUAN JINGSHUANG, WANG DAN, LI DONGQIANG
Year of Publication 04.08.2023
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Year of Publication 04.08.2023
Patent
Dual-power redundancy error correction instantaneous dose rate radiation hardening trigger of FDSOI process
SUN YU, YU CHUNQING, LI TONGDE, WANG LIANG, YUAN JINGSHUANG, WANG YAKUN, ZHAO YUANFU
Year of Publication 16.05.2023
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Year of Publication 16.05.2023
Patent
Dual-power redundancy latch transient dose rate radiation hardening flip-flop of FDSOI process
SUN YU, CAO WEIYI, LI TONGDE, YUAN JINGSHUANG, ZHAO YUANFU, DU QIAN, SUI CHENGLONG
Year of Publication 16.05.2023
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Year of Publication 16.05.2023
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Method and system for evaluating single-particle function error sensitive interval of reconfigurable chip
SONG LIGUO, SUN YU, YU CHUNQING, ZHANG YANLONG, LI TONGDE, YUE SUGE, WANG LIANG, WANG YAKUN, YUAN JINGSHUANG, ZHU YONGQIN
Year of Publication 26.03.2024
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Year of Publication 26.03.2024
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Multi-node and clock single event upset resistant latch based on DICE
SUN YU, YU CHUNQING, BAO YIHAO, LI TONGDE, WANG LIANG, WANG YAKUN, YUAN JINGSHUANG, DU QIAN, ZHU YONGQIN
Year of Publication 22.08.2023
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Year of Publication 22.08.2023
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Single-particle latch-up evaluation method for laser simulation magnetoresistive random access memory
SUN YU, YU CHUNQING, ZHANG YANLONG, BAO YIHAO, LI TONGDE, YUE SUGE, WANG LIANG, WANG YAKUN, YUAN JINGSHUANG, DU QIAN, ZHU YONGQIN
Year of Publication 31.10.2023
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Year of Publication 31.10.2023
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Total dose effect evaluation method and system of magnetoresistive random access memory
ZHENG HONGCHAO, CHEN LEI, YU CHUNQING, LI TONGDE, YUE SUGE, GUO WEI, WANG LIANG, YUAN JINGSHUANG, WANG YAKUN
Year of Publication 27.09.2022
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Year of Publication 27.09.2022
Patent
Redundant interlocking anti-multi-bit single event upset flip-flop circuit
SUN YU, YU CHUNQING, BAO YIHAO, LI TONGDE, WANG LIANG, YUAN JINGSHUANG, WANG YAKUN, DU QIAN, WANG YONG, ZHAO YUANFU, ZHU YONGQIN
Year of Publication 04.08.2023
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Year of Publication 04.08.2023
Patent