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"YUAN, CHI ALBERT"
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"YUAN, CHI ALBERT"
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Software-focused solution for arbitrary all-data odd sector size support
by
Malisic, Srdjan
,
Yuan
,
Chi Albert
Year of Publication
30.08.2022
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SOFTWARE-FOCUSED SOLUTION FOR ARBITRARY ALL-DATA ODD SECTOR SIZE SUPPORT
by
MALISIC, Srdjan
,
YUAN
,
Chi Albert
Year of Publication
29.04.2021
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Systems and methods for testing virtual functions of a device under test
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
Year of Publication
16.07.2024
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Lockless log and error reporting for automatic test equipment
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
Year of Publication
16.07.2024
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Automatic test equipment architecture providing odd sector size support
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
Year of Publication
01.07.2024
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Software-focused solution for arbitrary all-data odd sector size support
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
Year of Publication
01.10.2022
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Software-focused solution for arbitrary all-data odd sector size support
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
Year of Publication
16.02.2022
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Software-centric solution supported by arbitrary full data non-standard sector size
by
MALISIC SRDJAN
,
YUAN CHI ALBERT
Year of Publication
31.08.2021
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Management of hot add in a testing environment for DUTs that are CXL protocol enabled
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
,
CHEN, JENNY
,
QIU, REBECCA
Year of Publication
16.07.2024
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Systems and methods utilizing DAX memory management for testing CXL protocol enabled devices
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
,
CHEN, JENNY
,
QIU, REBECCA
Year of Publication
01.05.2024
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Systems and methods for testing CXL enabled devices in parallel
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
,
CHEN, JENNY
,
QIU, REBECCA
Year of Publication
01.05.2024
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CXL protocol enablement for test environment systems and methods
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
,
CHEN, JENNY
,
QIU, REBECCA
Year of Publication
01.05.2024
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Automated test equipment (ate) apparatus, method for testing using ate, and tester
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
,
JONES, MICHAEL
Year of Publication
21.12.2020
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Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
by
MALISIC, SRDJAN
,
YUAN
,
CHI ALBERT
,
JONES, MICHAEL
Year of Publication
01.09.2020
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Atomizing apparatus and process
by
SU; YAIN-HAUW
,
LIN; RAY-WEN
,
CHEN; YAIN-MING
,
TSAO;
CHI
-
YUAN ALBERT
Year of Publication
30.11.1999
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