SET/CMOS hybrid process and multiband filtering circuits
SONG, Ki-Whan, YONG KYU LEE, JAE SUNG SIM, JEOUNG, Hoon, JONG DUK LEE, PARK, Byung-Gook, YOU SEUNG JIN, KIM, Young-Wug
Published in IEEE transactions on electron devices (01.08.2005)
Published in IEEE transactions on electron devices (01.08.2005)
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Journal Article
Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors
Jinju Lee, Kangguo Cheng, Zhi Chen, Hess, K., Lyding, J.W., Young-Kwang Kim, Hyui-Seung Lee, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE electron device letters (01.05.2000)
Published in IEEE electron device letters (01.05.2000)
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Journal Article
Ultrathin gate oxide grown on nitrogen-implanted silicon for deep submicron CMOS transistors
Nam, In-Ho, Sim, Jae Sung, Hong, Sung In, Park, Byung-Gook, Lee, Jong Duk, Lee, Seung-Woo, Kang, Man-Sug, Kim, Young-Wug, Suh, Kwang-Pyuk, Lee, Won Seong
Published in IEEE transactions on electron devices (01.10.2001)
Published in IEEE transactions on electron devices (01.10.2001)
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Journal Article
A 0.25-μm, 600-MHz, 1.5-V, fully depleted SOI CMOS 64-bit microprocessor
Park, Sung Bae, Kim, Young Wug, Ko, Young Gun, Kim, Kwang Il, Kim, Il Kwon, Kang, Hee-Sung, Yu, Jin Oh, Suh, Kwang Pyuk
Published in IEEE journal of solid-state circuits (01.11.1999)
Published in IEEE journal of solid-state circuits (01.11.1999)
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Journal Article
Complementary Self-Biased Logics Based on Single-Electron Transistor (SET)/CMOS Hybrid Process
Song, Ki-Whan, Lee, Yong Kyu, Sim, Jae Sung, Kim, Kyung Rok, Lee, Jong Duk, Park, Byung-Gook, You, Young Sub, Park, Joo-On, Jin, You Seung, Kim, Young-Wug
Published in Japanese Journal of Applied Physics (01.04.2005)
Published in Japanese Journal of Applied Physics (01.04.2005)
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Journal Article
Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces
Kangguo Cheng, Jinju Lee, Karl, H., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
Separation of hot-carrier-induced interface trap creation and oxide charge trapping in PMOSFETs studied by hydrogen/deuterium isotope effect
Cheng, K., Lee, J., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kuang Pyuk Suh
Published in IEEE electron device letters (01.04.2001)
Published in IEEE electron device letters (01.04.2001)
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Journal Article
An alternative interpretation of hot electron interface degradation in NMOSFETs: isotope results irreconcilable with major defect generation by holes?
Hess, K., Jinju Lee, Zhi Chen, Lyding, J.W., Young-Kwang Kim, Bong-Seok Kim, Yong-Hee Lee, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE transactions on electron devices (01.09.1999)
Published in IEEE transactions on electron devices (01.09.1999)
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Journal Article
Effect of the silicidation reaction condition on the gate oxide integrity in Ti-polycide gate
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Conference Proceeding
Journal Article
Multilevel vertical-channel SONOS nonvolatile memory on SOI
Lee, Yong Kyu, Sim, Jae Sung, Sung, Suk Kang, Lee, Chang Ju, Kim, Tae Hun, Lee, Jong Duk, Park, Byung Gook, Lee, Dong Hun, Kim, Young Wug
Published in IEEE electron device letters (01.11.2002)
Published in IEEE electron device letters (01.11.2002)
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Journal Article
Integrated LC VCO Compatible with Memory Process for Gigahertz Clock Generation
Minseok Choi, Youngho Jung, Yeo Jo Yoon, Young-Wug Kim, Hyungcheol Shin
Published in 2006 IEEE International Conference on Semiconductor Electronics (01.11.2006)
Published in 2006 IEEE International Conference on Semiconductor Electronics (01.11.2006)
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Conference Proceeding
Deuterium pressure dependence of characteristics and hot-carrier reliability of CMOS devices
Cheng, Kangguo, Lee, Jinju, Chen, Zhi, Shah, Samir, Hess, Karl, Lyding, Joseph W., Kim, Young-Kwang, Kim, Young-Wug, Suh, Kuwang Pyuk
Published in Microelectronic engineering (01.08.2001)
Published in Microelectronic engineering (01.08.2001)
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Journal Article
Integration of MIM capacitors with low-k/Cu process for 90 nm analog circuit applications
Jeong-Hoon Ahm, Kyung-Tae Lee, Mu-Kyeung Jung, Yong-Jun Lee, Byung-Jun Oh, Seong-Ho Liu, Yoon-Hae Kim, Young-Wug Kim, Kwang-Pyuk Suh
Published in Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) (2003)
Published in Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) (2003)
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Conference Proceeding
Improved current performance of CMOSFETs with nitrogen incorporated HfO2-Al2O3 laminate gate dielectric
Hyung-Seok Jung, Yun-Seok Kim, Jong Pyo Kim, Jung Hyoung Lee, Jong-Ho Lee, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh, Hyuk Ju Ryu, Chang-Bong Oh, Young-Wug Kim, Kyung-Hwan Cho, Hion-Suck Baik, Young Su Chung, Hyo Sik Chang, Dae Won Moon
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
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Conference Proceeding
Three dimensional analysis of thermal degradation effects in FDSOI MOSFETs
Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim
Published in Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) (2000)
Published in Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) (2000)
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Conference Proceeding