by Yoshimura, Masayoshi, Takahashi, Yoshiyasu, Yamazaki, Hiroshi, Hosokawa, Toshinori
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)

by YAMAZAKI, Hiroshi, WAKAZONO, Motohiro, HOSOKAWA, Toshinori, YOSHIMURA, Masayoshi
Published in IEICE Transactions on Information and Systems (2013)

by Takata, Taiga, Yoshimura, Masayoshi, Matsunaga, Yusuke
Published in IPSJ Transactions on System LSI Design Methodology (2013)

by Yoshimura, M, Hershman, J M
Published in Thyroid (New York, N.Y.) (01.10.1995)

by Yoshimura, Masayoshi, Akamine, Yusuke, Matsunaga, Yusuke
Published in IPSJ Transactions on System LSI Design Methodology (2012)

by Yoshimura, Masayoshi
Published in The Journal of Reliability Engineering Association of Japan (01.12.2013)

by Hosokawa, Toshinori, Yamazaki, Hiroshi, Takeda, Shun, Yoshimura, Masayoshi
Published in 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) (01.07.2018)

by Ochi, Sayuri, Yamazaki, Hiroshi, Hosokawa, Toshinori, Yoshimura, Masayoshi
Published in 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) (01.07.2018)

by Asami, Ryuki, Hosokawa, Toshinori, Yoshimura, Masayoshi, Arai, Masayuki
Published in 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (19.10.2020)

by Yoshimura, Masayoshi, Hosokawa, Toshinori, Ohta, Misuyasu
Published in Electronics & communications in Japan. Part 2, Electronics (01.05.2006)

by Yoshimura, Masayoshi, Bouyashiki, Tomohiro, Hosokawa, Toshinori
Published in 2017 IEEE 22nd Pacific Rim International Symposium on Dependable Computing (PRDC) (01.01.2017)

by Yoshimura, Masayoshi, Takeuchi, Yuki, Yamazaki, Hiroshi, Hosokawa, Toshinori
Published in 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2019)

by Hosokawa, Toshinori, Yamazaki, Hiroshi, Misawa, Kenichiro, Yoshimura, Masayoshi, Hirama, Yuki, Arai, Masavuki, Arai, Masayuki
Published in 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2019)

by Yoshimura, Masayoshi, Akamine, Yusuke, Matsunaga, Yusuke
Published in Information and Media Technologies (01.01.2012)

by Yoshimura, Masayoshi, Ogawa, Hiroshi, Hosokawa, Toshinori, Yamazaki, Koji
Published in 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (01.04.2010)

by HORI, Yohei, SUZUKI, Daisuke, YOSHIMURA, Masayoshi, YOSHIKAWA, Masaya, FUJINO, Takeshi
Published in The Journal of Reliability Engineering Association of Japan (01.12.2013)

by YASUURA, Hiroto, MATSUNAGA, Yusuke, Yoshimura, Masayoshi, SUGIHARA, Makoto
Published in The Journal of Reliability Engineering Association of Japan (01.12.2013)

by Yoshimura, Masayoshi, Ogita, Amy, Hosokawa, Toshinori
Published in 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (01.10.2013)

by Nishikawa, M, Yoshimura, M, Yoshikawa, N, Toyoda, N, Yonemoto, T, Ogawa, Y, Mori, S, Tabata, S, Tokoro, T, Sakaguchi, N, Inada, M
Published in Endocrine journal (01.08.1997)

by NISHIKAWA, MITSUSHIGE, TOYODA, NAGAOKI, YONEMOTO, TOSHINAGA, FUJIYAMA, ATSUKO, OGAWA, YOSHIFUMI, TOKORO, TOSHIKO, SAKAGUCHI, NORIKO, YOSHIMURA, MASAYOSHI, YOSHIKAWA, NORIKO, TABATA, SAKUYOSHI, KUMAZAWA, HIROFUMI, YAMASHITA, TOSHIO, SAKAIDA, NORIKO, OKAMURA, AKIHARU, KASAGI, KANJI, INADA, MITSUO
Published in Endocrine Journal (1998)