Sensing margin trend with technology scaling in MRAM
Song, Jee-Hwan, Kim, Jisu, Kang, Seung H., Yoon, Sei-Seung, Jung, Seong-Ook
Published in International journal of circuit theory and applications (01.03.2011)
Published in International journal of circuit theory and applications (01.03.2011)
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Journal Article
Reducing SRAM Power Using Fine-Grained Wordline Pulsewidth Control
Abu-Rahma, M.H., Anis, M., Sei Seung Yoon
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.2010)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.2010)
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Journal Article
Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS
Abu-Rahma, M. H., Ying Chen, Wing Sy, Wee Ling Ong, Leon Yeow Ting, Sei Seung Yoon, Han, M., Terzioglu, E.
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)
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Conference Proceeding
High performance mobile SoC design and technology co-optimization to mitigate high-K metal gate process induced variations
Yang, Sam, Lixin Ge, Lin, Jeff, Han, Michael, Da Yang, Wang, Joseph, Mahmood, Kasim, Song, Tony, Yuan, Dana, Dongwon Seo, Pedrali-Noy, Marzio, Alladi, Dinesh, Wadhwa, Sameer, Xiaoliang Bai, Liang Dai, Sei Seung Yoon, Terzioglu, Esin, Bazarjani, Seyfi, Yeap, Geoffrey
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
Non-Gaussian distribution of SRAM read current and design impact to low power memory using Voltage Acceleration Method
Wang, J., Ping Liu, Yandong Gao, Deshmukh, Pankaj, Yang, Sam, Ying Chen, Wing Sy, Lixin Ge, Terzioglu, Esin, Abu-Rahma, Mohamed, Garg, Manish, Sei Seung Yoon, Han, Michael, Sani, Mehdi, Yeap, Geoffrey
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
Experiments and analysis to characterize logic state retention limitations in 28nm process node
Dasnurkar, S., Datta, A., Abu-Rahma, M., Nguyen, H., Villafana, M., Rasouli, H., Tamjidi, S., Ming Cai, Sengupta, S., Chidambaram, P. R., Thirumala, R., Kulkarni, N., Seeram, P., Bhadri, P., Patel, P., Sei Seung Yoon, Terzioglu, E.
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)
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Conference Proceeding
A robust single supply voltage SRAM read assist technique using selective precharge
Abu-Rahma, M.H., Anis, M., Sei Seung Yoon
Published in ESSCIRC 2008 - 34th European Solid-State Circuits Conference (01.09.2008)
Published in ESSCIRC 2008 - 34th European Solid-State Circuits Conference (01.09.2008)
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Conference Proceeding
A methodology for statistical estimation of read access yield in SRAMs
Abu-Rahma, Mohamed H., Chowdhury, Kinshuk, Wang, Joseph, Chen, Zhiqin, Yoon, Sei Seung, Anis, Mohab
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
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Conference Proceeding
Low power embedded memory design - process to system level considerations
Terzioglu, E, Sei Seung Yoon, ChangHo Jung, Chaba, R, Boynapalli, V, Abu-Rahma, M, Wang, J, Yang, S, Nallapati, G, Thean, A, Chidambaram, C, Han, M, Yeap, G, Sani, M
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding