A Highly Linear Two-Stage Amplifier Integrated Circuit Using InGaP/GaAs HBT
Choi, Kyunggon, Kim, Minsu, Kim, Hyungchul, Jung, Sungchan, Cho, Jaeyong, Yoo, Sungchul, Kim, Yong Hwan, Yoo, Hyungmo, Yang, Youngoo
Published in IEEE journal of solid-state circuits (01.10.2010)
Published in IEEE journal of solid-state circuits (01.10.2010)
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Journal Article
Optical ellipsometry for SiON gate production monitoring
Zhiming Jiang, Sungchul Yoo, Zhengquan Tan
Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
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Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
Conference Proceeding
Scatterometry measurement for SiGe AEI sigma-shaped gate structures of 28nm technology
Yu-Wen Wang, Yeh, A., Pao-Chung Lin, Chin-Cheng Chien, Lin, C-H B., Xu, Z-Q J., Cheng, C-Y H., Sungchul Yoo, Lin, J., Mihardja, L., Perry-Sullivan, C.
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
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Conference Proceeding
Methodology for N% recovery post PM for aged/non-annealed SPA oxynitride gate without XPS referencing
JaeHyun Kim, ChangHwan Lee, SeongJun Heo, HyungWon Yoo, ChulHong Kim, Sungchul Yoo, Nam Hee Yoon, Zhiming Jiang, Hwan Seong Moon
Published in 2010 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2010)
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Published in 2010 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2010)
Conference Proceeding
반도체 구조물의 데이터 드리븐 파라미터화 및 측정을 위한 방법 및 시스템
ROY PROTEEK CHANDAN, GELLINEAU ANTONIO, PANDEV STILIAN IVANOV, JAYARAMAN ARVIND, PARK HYOWON, YOO SUNGCHUL
Year of Publication 29.07.2024
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Year of Publication 29.07.2024
Patent
PURIFICATION SYSTEM FOR BIOLOGICAL MATERIALS COMPRISING SEGREGATED PURIFICATION SECTIONS
KIM, Heejeong, KIM, Yoojin, JUNG, Jaewoong, YOO, Sungchul, CHO, Youngjin, HA, Junghwan
Year of Publication 04.07.2024
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Year of Publication 04.07.2024
Patent
Purification System for Biological Materials Comprising Segregated Purification Sections
CHO YOUNGJIN, KIM HEEJEONG, KIM YOOJIN, HA JUNGHWAN, JUNG JAEWOONG, YOO SUNGCHUL
Year of Publication 04.07.2024
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Year of Publication 04.07.2024
Patent
SYSTEM AND METHOD FOR MEASUREMENT OR ANALYSIS OF SPECIMEN
ZHAO QIANG, FIELDEN JOHN, LI XING, KAACK TORSTEN, TAN ZHENGQUAN, JANIK GARY, YOO SUNGCHUL
Year of Publication 11.10.2018
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Year of Publication 11.10.2018
Patent
SYSTEM AND METHOD FOR MEASUREMENT OR ANALYSIS OF SPECIMEN
ZHAO QIANG, FIELDEN JOHN, LI XING, KAACK TORSTEN, TAN ZHENGQUAN, JANIK GARY, YOO SUNGCHUL
Year of Publication 28.09.2017
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Year of Publication 28.09.2017
Patent
SYSTEMS AND METHODS FOR MEASUREMENT OR ANALYSIS OF SPECIMEN
ZHAO QIANG, FIELDEN JOHN, LI XING, KAACK TORSTEN, TAN ZHENGQUAN, JANIK GARY, YOO SUNGCHUL
Year of Publication 09.07.2015
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Year of Publication 09.07.2015
Patent
MULTI-MODEL METROLOGY
SHCHEGROV ANDREI V, LEE LIE QUAN RICH, LI XIN, POSLAVSKY LEONID, CAO MENG, KIM IN KYO, YOO SUNGCHUL, PARK SANGBONG
Year of Publication 02.05.2016
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Year of Publication 02.05.2016
Patent
Methods and systems for combining x-ray metrology data sets to improve parameter estimation
Gellineau, Antonio Arion, Yoo, Sungchul, Shchegrov, Andrei V, Liman, Christopher
Year of Publication 21.05.2024
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Year of Publication 21.05.2024
Patent
METHODS AND SYSTEMS FOR COMBINING X-RAY METROLOGY DATA SETS TO IMPROVE PARAMETER ESTIMATION
YOO, Sungchul, SHCHEGROV, Andrei V, GELLINEAU, Antonio Arion, LIMAN, Christopher
Year of Publication 29.11.2021
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Year of Publication 29.11.2021
Patent
Methods And Systems For Combining X-Ray Metrology Data Sets To Improve Parameter Estimation
Gellineau, Antonio Arion, Yoo, Sungchul, Shchegrov, Andrei V, Liman, Christopher
Year of Publication 22.10.2020
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Year of Publication 22.10.2020
Patent