Investigation of Device Performance and Negative Bias Temperature Instability of Plasma Nitrided Oxide in Nanoscale p-Channel Metal–Oxide–Semiconductor Field-Effect Transistor's
Han, In-Shik, Ji, Hee-Hwan, Goo, Tae-Gyu, Yoo, Ook-Sang, Choi, Won-Ho, Kim, Yong-Goo, Park, Sung-Hyung, Lee, Heui-Seung, Kang, Young-Seok, Kim, Dae-Byung, Lee, Hi-Deok
Published in Japanese Journal of Applied Physics (01.04.2008)
Published in Japanese Journal of Applied Physics (01.04.2008)
Get full text
Journal Article
PBTI-Associated High-Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High- k Dielectrics
Kyong Taek Lee, Chang Yong Kang, Ook Sang Yoo, Rino Choi, Byoung Hun Lee, Lee, J.C., Hi-Deok Lee, Yoon-Ha Jeong
Published in IEEE electron device letters (01.04.2008)
Published in IEEE electron device letters (01.04.2008)
Get full text
Journal Article
ALGORITHM AND METHOD FOR DYNAMICALLY VARYING QUANTIZATION PRECISION OF DEEP LEARNING NETWORK
LIM, Kyeong Jong, LEE, Hyuk Jae, RYU, Soo Jung, YOO, Ook Sang, CHON, Ji Yea
Year of Publication 07.07.2022
Get full text
Year of Publication 07.07.2022
Patent
Characterization of device performance and reliability of high performance Ge-on-Si field-effect transistor
Choi, Won-Ho, Oh, Jungwoo, Yoo, Ook-Sang, Han, In-Shik, Na, Min-Ki, Kwon, Hyuk-Min, Park, Byung-Suk, Majhi, P., Tseng, H.-H., Jammy, R., Lee, Hi-Deok
Published in Microelectronic engineering (01.12.2011)
Published in Microelectronic engineering (01.12.2011)
Get full text
Journal Article
Conference Proceeding
Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs
Yoo, Ook Sang, Oh, Jungwoo, Min, Kyung Seok, Kang, Chang Yong, Lee, B.H., Lee, Kyong Taek, Na, Min Ki, Kwon, Hyuk-Min, Majhi, P., Tseng, H-H, Jammy, Raj, Wang, J.S., Lee, Hi-Deok
Published in Microelectronic engineering (01.03.2009)
Published in Microelectronic engineering (01.03.2009)
Get full text
Journal Article
Conference Proceeding
Effects of In Situ O2 Plasma Treatment on OFF-State Leakage and Reliability in Metal-Gate/High-k Dielectric MOSFETs
KYONG TAEK LEE, CHANG YONG KANG, JEONG, Yoon-Ha, BYUNG SUN JU, CHOI, Rino, KYUNG SEOK MIN, OOK SANG YOO, BYOUNG HUN LEE, JAMMY, Raj, LEE, Jack C, LEE, Hi-Deok
Published in IEEE electron device letters (01.06.2008)
Published in IEEE electron device letters (01.06.2008)
Get full text
Journal Article
Comparison of La-based high- k dielectrics: HfLaSiON and HfLaON
Choi, Won-Ho, Han, In-Shik, Kwon, Hyuk-Min, Goo, Tae-Gyu, Na, Min-Ki, Yoo, Ook-Sang, Lee, Ga-Won, Kang, Chang Yong, Choi, Rino, Song, Seung Chul, Lee, Byoung Hun, Jammy, Raj, Jeong, Yoon-Ha, Lee, Hi-Deok
Published in Microelectronic engineering (01.03.2009)
Published in Microelectronic engineering (01.03.2009)
Get full text
Journal Article
Conference Proceeding