by Chae, Sieun, Yoo, Sangmin, Kioupakis, Emmanouil, Lu, Wei D., Heron, John T.
Published in Applied physics letters (12.08.2024)

by Park, Yongmo, Wang, Ziyu, Yoo, Sangmin, Lu, Wei D.
Published in IEEE journal on exploratory solid-state computational devices and circuits (01.12.2022)

by Wang, Ziyu, Wu, Yuting, Park, Yongmo, Yoo, Sangmin, Wang, Xinxin, Eshraghian, Jason K., Lu, Wei D.
Published in Advanced intelligent systems (01.12.2023)

by Yoo, Sangmin, Park, Yongmo, Wang, Ziyu, Wu, Yuting, Medepalli, Saaketh, Thio, Wesley, Lu, Wei D.
Published in Advanced intelligent systems (01.11.2022)

by Yoo, Sangmin, Shin, Se-Eun, Takata, Naoki, Kobashi, Makoto
Published in Journal of materials science (01.10.2022)

by Yoo, Sangmin, Shin, Se-Eun, Takata, Naoki, Kobashi, Makoto
Published in Journal of materials science (01.10.2022)

by Li, Yiyang, Fuller, Elliot J., Sugar, Joshua D., Yoo, Sangmin, Ashby, David S., Bennett, Christopher H., Horton, Robert D., Bartsch, Michael S., Marinella, Matthew J., Lu, Wei D., Talin, A. Alec
Published in Advanced materials (Weinheim) (01.11.2020)

by Kim, Youngmin, Park, Hongjong, Yoo, Sangmin
Published in IEEE solid-state circuits letters (2023)

by Yoo, Sangmin, Wu, Yuting, Park, Yongmo, Lu, Wei D.
Published in Advanced electronic materials (01.08.2022)

by Lin, Chih‐Yang, Chen, Jia, Chen, Po‐Hsun, Chang, Ting‐Chang, Wu, Yuting, Eshraghian, Jason K., Moon, John, Yoo, Sangmin, Wang, Yu‐Hsun, Chen, Wen‐Chung, Wang, Zhi‐Yang, Huang, Hui‐Chun, Li, Yi, Miao, Xiangshui, Lu, Wei D., Sze, Simon M.
Published in Small (Weinheim an der Bergstrasse, Germany) (01.10.2020)

by Kim, Youngmin, Park, Hongjong, Lee, Iljin, Hur, Joonhoi, Yoo, Sangmin
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)

by Lee, Jongsoo, Jang, Jaehyuk, Lee, Wooseok, Suh, Bosung, Yoo, Heeyong, Park, Beomyu, Woo, Jeongkyun, Ryu, Inhyo, Han, Honggul, Kim, Jaeyoung, Kang, Hojung, Kang, John H., Lee, Minseob, Lee, Danbi, Son, Hyeonuk, Lee, Suhyeon, Kim, Soyeon, Kim, Dong-Chan, Yoon, Dae-Young, Park, Hongjong, Lee, Sangsung, Bae, Jeongyeol, Kim, Huijung, Lee, Joonhee, Yoo, Sangmin
Published in IEEE journal of solid-state circuits (21.08.2024)

by Wu, Yuting, Yoo, Sangmin, Meng, Fan-Hsuan, Lu, Wei D.
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)

by Li, Yiyang, Fuller, Elliot J., Sugar, Joshua D., Yoo, Sangmin, Ashby, David S., Bennett, Christopher H., Horton, Robert D., Bartsch, Michael S., Marinella, Matthew J., Lu, Wei D., Talin, A. Alec
Published in Advanced materials (Weinheim) (01.11.2020)

by HWANG JUNGHUN, HAN WOOKHYUN, LEE HOJAE, YOO SANGMIN, KIM KWANGSU, KIM BYOUNGGIL
Year of Publication 16.12.2022

by Yoon, Minyoung, Choi, Dooseok, Lee, Youngki, Kwon, Kyeol, Lee, Hongkoo, Jeong, Woncheol, Yang, Doohyun, Jung, Seungyoon, Choi, Dongkwon, Baek, Sanghyun, Hur, Joonhoi, Yoo, Sangmin
Published in 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 (11.06.2023)

by Li, Jingxian, Appachar, Anirudh, Peczonczyk, Sabrina L., Harrison, Elisa T., Ievlev, Anton V., Hood, Ryan, Shin, Dongjae, Yoo, Sangmin, Roest, Brianna, Sun, Kai, Beckmann, Karsten, Popova, Olya, Chiang, Tony, Wahby, William S., Jacobs-Godrim, Robin B., Marinella, Matthew J., Maksymovych, Petro, Heron, John T., Cady, Nathaniel, Lu, Wei D., Kumar, Suhas, Talin, A. Alec, Sun, Wenhao, Li, Yiyang
Published in Matter (01.08.2024)

by Yun, Jongwon, Lim, Hongkie, Jeong, Jaeyeon, Lee, Iljin, Kim, Doyoon, Kim, Kyunghwan, Choi, Han-Woong, Park, Geonho, Baek, Goeun, Sung, Eun-Taek, Jain, Ajaypat, Malekzadeh, Foad A., Bhagavatula, Venumadhav, Lu, Ivan S.-C., Son, Sangwon, Park, Hyun-Chul, Hur, Joonhoi, Yoo, Sangmin
Published in 2024 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (16.06.2024)

by Lee, Jongsoo, Jang, Jaehyuk, Lee, Wooseok, Suh, Bosung, Yoo, Heeyong, Park, Beomyu, Woo, Jeongkyun, Jang, Jaeeun, Ryu, Inhyo, Han, Honggul, Kim, Jaeyoung, Kang, Byoungjoong, Kang, Minchul, Kang, Hojung, Kang, John, Lee, Minseob, Lee, Danbi, Son, Hyeonuk, Lee, Suhyeon, Kim, Soyeon, Park, Hongjong, Lee, Sangsung, Bae, Jeongyeol, Kim, Huijung, Lee, Joonhee, Yoo, Sangmin
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)

by Bae, Jeongyeol, Lee, Sangsung, Lee, Joonggeun, Jo, Ikkyun, Kim, Heesoo, Yoon, Kyunghyun, Kim, Taejong, Lee, Jiyoung, Lee, Myunghun, Lee, Jaeseung, Jeong, Jongmin, Lee, Sungjun, Kim, Taewan, Kim, Sungjoo, Cho, Gwangsik, Kim, Duksoo, Lee, Sangyun, Jang, Pilsung, Yang, Euibong, Song, Jeongmin, Park, Gwangchun, Choi, Se-Eun, Son, Juhee, Ko, Won, Kim, Jonghyun, Park, Seong Ho, Lee, Sangho, Lee, Yoonki, Park, Euiyoung, Kang, Pillseong, Kim, Taeyeon, Lee, Hyojin, Han, Byungki, Lee, Joonhee, Lee, Jongsoo, Yoo, Sangmin
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)