Accurate Extraction of Effective Channel Length and Source/Drain Series Resistance in Ultrashort-Channel MOSFETs by Iteration Method
KIM, Junsoo, LEE, Jaehong, SONG, Ickhyun, YUN, Yeonam, JONG DUK LEE, PARK, Byung-Gook, SHIN, Hyungcheol
Published in IEEE transactions on electron devices (01.10.2008)
Published in IEEE transactions on electron devices (01.10.2008)
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Journal Article
fmax Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor
JHON, Hee-Sauk, LEE, Jae-Hong, LEE, Jaeho, OH, Byoungchan, SONG, Ickhyun, YEONAM YUN, PARK, Byung-Gook, LEE, Jong-Duk, SHIN, Hyungcheol
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
f Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor
Hee-Sauk Jhon, Jae-Hong Lee, Jaeho Lee, Byoungchan Oh, Ickhyun Song, Yeonam Yun, Byung-Gook Park, Jong-Duk Lee, Hyungcheol Shin
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
On the Characteristics and Spatial Dependence of Channel Thermal Noise in Nanoscale Metal–Oixde–Semiconductor Field Effect Transistors
Jeon, Jongwook, Yun, Yeonam, Kim, Junsoo, Park, Byung-Gook, Lee, Jong Duk, Shin, Hyungcheol
Published in Japanese Journal of Applied Physics (01.04.2008)
Published in Japanese Journal of Applied Physics (01.04.2008)
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Journal Article
A New Noise Parameter Model of Short-Channel MOSFETs
Jongwook Jeon, Ickhyun Song, In Man Kang, Yeonam Yun, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin
Published in 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (01.06.2007)
Published in 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (01.06.2007)
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Conference Proceeding
Small-signal modeling of MOSFET cascode with merged diffusion
Yun, Yeonam, Jhon, Hee-Sauk, Jeon, Jongwook, Lee, Jaehong, Shin, Hyungcheol
Published in Solid-state electronics (01.05.2009)
Published in Solid-state electronics (01.05.2009)
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Journal Article
[Formula Omitted] Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor
Jhon, Hee-Sauk, Lee, Jae-Hong, Lee, Jaeho, Oh, Byoungchan, Song, Ickhyun, Yun, Yeonam, Park, Byung-Gook, Lee, Jong-Duk, Shin, Hyungcheol
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
Extraction of Effective Carrier Velocity in RF MOSFETs
Yeonam Yun, In Man Kang, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin
Published in 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (01.01.2007)
Published in 2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (01.01.2007)
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Conference Proceeding
Multigate MOSFET in a Bulk Technology by Integrating Polysilicon-Filled Trenches
Ramadout, B., Guo-Neng Lu, Carrere, J.-P., Pinzelli, L., Perrot, C., Rivoire, M., Nemouchi, F.
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
f max Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor
Jhon, Hee-Sauk, Lee, Jae-Hong, Lee, Jaeho, Oh, Byoungchan, Song, Ickhyun, Yun, Yeonam, Park, Byung-Gook, Lee, Jong-Duk, Shin, Hyungcheol
Published in IEEE electron device letters (01.01.2009)
Published in IEEE electron device letters (01.01.2009)
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Journal Article
Temperature dependence of effective channel length, source/drain resistance, and electron mobility in sub-50 nm MOSFETs
Kim, Junsoo, Lee, Jaehong, Yun, Yeonam, Park, Byung-Gook, Lee, Jong Duk, Shin, Hyungcheol
Published in 2008 IEEE Silicon Nanoelectronics Workshop (01.06.2008)
Published in 2008 IEEE Silicon Nanoelectronics Workshop (01.06.2008)
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Conference Proceeding