A partially insulated field-effect transistor (PiFET) as a candidate for scaled transistors
Yeo, K.H., Oh, C.W., Kim, S.M., Kim, M.S., Lee, C.S., Lee, S.Y., Han, S.Y., Yoon, E.J., Cho, H.J., Lee, D.Y., Yoon, B.M., Rhee, H.S., Lee, B.C., Choe, J.D., Chung, I., Park, D., Kim, K.
Published in IEEE electron device letters (01.06.2004)
Published in IEEE electron device letters (01.06.2004)
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Journal Article
Co-existence of Random Telegraph Noise and Single-Hole-Tunneling State in Gate-All-Around PMOS Silicon Nanowire Field-Effect-Transistors
Hong, Byoung-Hak, Lee, Seong-Joo, Hwang, Sung-Woo, Cho, Keun-Hwi, Yeo, Kyoung-Hwan, Kim, Dong-Won, Jin, Gyo-Young, Park, Dong-Gun
Published in Journal of semiconductor technology and science (01.06.2011)
Published in Journal of semiconductor technology and science (01.06.2011)
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Journal Article
Interface Trap Density of Gate-All-Around Silicon Nanowire Field-Effect Transistors With TiN Gate: Extraction and Compact Model
Najam, Faraz, Yun Seop Yu, Keun Hwi Cho, Kyoung Hwan Yeo, Dong-Won Kim, Jong Seung Hwang, Sansig Kim, Sung Woo Hwang
Published in IEEE transactions on electron devices (01.08.2013)
Published in IEEE transactions on electron devices (01.08.2013)
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Journal Article
Investigation on hot carrier reliability of Gate-All-Around Twin Si Nanowire Field Effect Transistor
Yun Young Yeoh, Sung Dae Suk, Ming Li, Kyoung Hwan Yeo, Dong-Won Kim, Gyoyoung Jin, Kyoungsuk Oh
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Twin silicon nanowire FET (TSNWFET) On SOI with 8 nm silicon nanowires and 25 nm surrounding TiN gate
Dong-Won Kim, Ming Li, Kyoung Hwan Yeo, Yun Young Yeoh, Sung Dae Suk, Keun Hwi Cho, Kyungseok Oh, Won-Seong Lee
Published in 2008 IEEE International SOI Conference (01.10.2008)
Published in 2008 IEEE International SOI Conference (01.10.2008)
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Conference Proceeding
Co-existence of Random Telegraph Noise and Single-Hole-Tunneling State in Gate-All-Around PMOS Silicon Nanowire Field-Effect-Transistors
Hong, Byoung-Hak, Lee, Seong-Joo, Hwang, Sung-Woo, Cho, Keun-Hwi, Yeo, Kyoung-Hwan, Kim, Dong-Won, Jin, Gyo-Young, Park, Dong-Gun
Published in Journal of semiconductor technology and science (2011)
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Published in Journal of semiconductor technology and science (2011)
Journal Article
Characterization and Modeling of 1/ f Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides
Rock-Hyun Baek, Chang-Ki Baek, Hyun-Sik Choi, Jeong-Soo Lee, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Kinam Kim, Kim, D M, Yoon-Ha Jeong
Published in IEEE transactions on nanotechnology (01.05.2011)
Published in IEEE transactions on nanotechnology (01.05.2011)
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Journal Article
High-Performance Twin Silicon Nanowire MOSFET (TSNWFET) on Bulk Si Wafer
Suk, Sung Dae, Yeo, Kyoung Hwan, Cho, Keun Hwi, Li, Ming, Yeoh, Yun Young, Lee, Sung-Young, Kim, Sung Min, Yoon, Eun Jung, Kim, Min Sang, Oh, Chang Woo, Kim, Sung Hwan, Kim, Dong-Won, Park, Donggun
Published in IEEE transactions on nanotechnology (01.03.2008)
Published in IEEE transactions on nanotechnology (01.03.2008)
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Journal Article
Investigation of nanowire size dependency on TSNWFET
Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Keun Hwi Cho, In Kyung Ku, Hong Cho, WonJun Jang, Dong-Won Kim, Donggun Park, Won-Seong Lee
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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Conference Proceeding
C- V Characteristics in Undoped Gate-All-Around Nanowire FET Array
Rock-Hyun Baek, Chang-Ki Baek, Sang-Hyun Lee, Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Jeong-Soo Lee, Kim, D M, Yoon-Ha Jeong
Published in IEEE electron device letters (01.02.2011)
Published in IEEE electron device letters (01.02.2011)
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Journal Article
Temperature-Dependent Characteristics of Cylindrical Gate-All-Around Twin Silicon Nanowire MOSFETs (TSNWFETs)
Cho, Keun Hwi, Suk, Sung Dae, Yeoh, Yun Young, Li, Ming, Yeo, Kyoung Hwan, Kim, Dong-Won, Park, Donggun, Lee, Won-Seong, Jung, Young Chai, Hong, Byung Hak, Hwang, Sung Woo
Published in IEEE electron device letters (01.12.2007)
Published in IEEE electron device letters (01.12.2007)
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Journal Article
Sub-10 nm gate-all-around CMOS nanowire transistors on bulk Si substrate
Ming Li, Kyoung Hwan Yeo, Sung Dae Suk, Yun Young Yeoh, Dong-Won Kim, Tae Young Chung, Kyung Seok Oh, Won-Seong Lee
Published in 2009 Symposium on VLSI Technology (01.06.2009)
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Published in 2009 Symposium on VLSI Technology (01.06.2009)
Conference Proceeding
Extracting Mobility Degradation and Total Series Resistance of Cylindrical Gate-All-Around Silicon Nanowire Field-Effect Transistors
Choi, Luryi, Hong, Byoung Hak, Jung, Young Chai, Cho, Keun Hwi, Yeo, Kyoung Hwan, Kim, Dong-Won, Jin, Gyo Young, Oh, Kyung Seok, Lee, Won-Seong, Song, Sang-Hun, Rieh, Jae Sung, Whang, Dong Mok, Hwang, Sung Woo
Published in IEEE electron device letters (01.06.2009)
Published in IEEE electron device letters (01.06.2009)
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Journal Article
Partially-insulated MOSFET (PiFET) and Its Application to DRAM Cell Transistor
Oh, Chang-Woo, Kim, Sung-Hwan, Yeo, Kyoung-Hwan, Kim, Sung-Min, Kim, Min-Sang, Choe, Jeong-Dong, Kim, Dong-Won, Park, Dong-Gun
Published in Journal of semiconductor technology and science (2006)
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Published in Journal of semiconductor technology and science (2006)
Journal Article
Low Voltage Program/Erase Characteristics of Si Nanocrystal Memory with Damascene Gate FinFET on Bulk Si Wafer
Choe, Jeong-Dong, Yeo, Kyoung-Hwan, Ahn, Young-Joon, Lee, Jong-Jin, Lee, Se-Hoon, Choi, Byung-Yong, Sung, Suk-Kang, Cho, Eun-Suk, Lee, Choong-Ho, Kim, Dong-Won, Chung, Il-Sub, Park, Dong-Gun, Ryu, Byung-Il
Published in Journal of semiconductor technology and science (2006)
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Published in Journal of semiconductor technology and science (2006)
Journal Article
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KIM IL RYONG, KIM JU YOUN, CHUNG JAE YUP, KIM JIN WOOK, YEO KYOUNG HWAN, JEONG YONG GI
Year of Publication 30.10.2019
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Year of Publication 30.10.2019
Patent
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Year of Publication 18.10.2019
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