Optical Third-Harmonic Generation in Graphene
Hong, Sung-Young, Dadap, Jerry I., Petrone, Nicholas, Yeh, Po-Chun, Hone, James, Osgood, Richard M.
Published in Physical review. X (10.06.2013)
Published in Physical review. X (10.06.2013)
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Journal Article
Improving Performance and Breakdown Voltage in Normally-Off GaN Recessed Gate MIS-HEMTs Using Atomic Layer Etching and Gate Field Plate for High-Power Device Applications
Liu, An-Chen, Tu, Po-Tsung, Chen, Hsin-Chu, Lai, Yung-Yu, Yeh, Po-Chun, Kuo, Hao-Chung
Published in Micromachines (Basel) (01.08.2023)
Published in Micromachines (Basel) (01.08.2023)
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Journal Article
Coverage-Dependent Modification of the Surface Electronic Structure of an Organic-Semiconductor-Adsorbate Layer
Hong, Sung-Young, Yeh, Po-Chun, Lee, Ilkyu, Yu, Jaeeun, Dadap, Jerry I, Nuckolls, Colin, Osgood, Richard M
Published in Journal of physical chemistry. C (27.03.2014)
Published in Journal of physical chemistry. C (27.03.2014)
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Journal Article
Direct measurement of the thickness-dependent electronic band structure of MoS2 using angle-resolved photoemission spectroscopy
Jin, Wencan, Yeh, Po-Chun, Zaki, Nader, Zhang, Datong, Sadowski, Jerzy T, Al-Mahboob, Abdullah, van der Zande, Arend M, Chenet, Daniel A, Dadap, Jerry I, Herman, Irving P, Sutter, Peter, Hone, James, Osgood, Jr, Richard M
Published in Physical review letters (03.09.2013)
Published in Physical review letters (03.09.2013)
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Journal Article
Direct Measurement of the Tunable Electronic Structure of Bilayer MoS2 by Interlayer Twist
Yeh, Po-Chun, Jin, Wencan, Zaki, Nader, Kunstmann, Jens, Chenet, Daniel, Arefe, Ghidewon, Sadowski, Jerzy T, Dadap, Jerry I, Sutter, Peter, Hone, James, Osgood, Richard M
Published in Nano letters (10.02.2016)
Published in Nano letters (10.02.2016)
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Journal Article
Unraveling the Wake-Up Mechanism in Ultrathin Ferroelectric Hf0.5 Zr0.5O₂: Interfacial Layer Soft Breakdown and Physical Modeling
Cho, Chen-Yi, Chao, Tzu-Yi, Lin, Tzu-Yao, Wang, I-Ting, De, Sourav, Chen, Yu-Sheng, Ong, Yi-Ching, Lin, Yu-De, Yeh, Po-Chun, Hou, Tuo-Hung
Published in IEEE transactions on electron devices (01.05.2024)
Published in IEEE transactions on electron devices (01.05.2024)
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Journal Article
Promising Engineering Approaches for Improving the Reliability of HfZrO x 2-D and 3-D Ferroelectric Random Access Memories
Lin, Yu-De, Yeh, Po-Chun, Tzeng, Pei-Jer, Hou, Tuo-Hung, Wu, Chih-I, King, Ya-Chin, Lin, Chrong Jung
Published in IEEE transactions on electron devices (01.12.2020)
Published in IEEE transactions on electron devices (01.12.2020)
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Journal Article
GaN on Si RF performance with different AlGaN back barrier
Hsieh, Chang-Yan, Chen, Hui-Yu, Tu, Po-Tsung, Chen, Jui-Chin, Yang, Hsin-Yun, Yeh, Po-Chun, Hsieh, De, Liu, Hsueh-Hsing, Fu, Yi-Keng, Sheu, Shyh-Shyuan, Kuo, Hao-Chung, Wu, Yuh-Renn, Lo, Wei-Chung, Chang, Shih-Chieh
Published in 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) (17.04.2023)
Published in 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) (17.04.2023)
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Conference Proceeding
Scaling performance of Ga2O3/GaN nanowire field effect transistor
Li, Chi-Kang, Yeh, Po-Chun, Yu, Jeng-Wei, Peng, Lung-Han, Wu, Yuh-Renn
Published in Journal of applied physics (28.10.2013)
Published in Journal of applied physics (28.10.2013)
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Journal Article
Enhancing bright-field image of microorganisms by local plasmon of Ag nanoparticle array
Hsiao, Hui-Hsin, Yeh, Po-Chun, Wang, Huai-Hsien, Cheng, Tian-You, Chang, Hung-Chun, Wang, Yuh-Lin, Wang, Juen-Kai
Published in Optics letters (01.03.2014)
Published in Optics letters (01.03.2014)
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Journal Article
CMOS-compatible GaN HEMT on 200mm Si-substrate for RF application
Yeh, Po-Chun, Tu, Po-Tsung, Liu, Hsueh-Hsing, Hsu, Chien-Hua, Yang, Hsin-Yun, Fu, Yi-Keng, Lee, Li-Heng, Tzeng, Pei-Jer, Wu, Yuh-Renn, Sheu, Shyh-Shyuan, Lo, Wei-Chung, Wu, Chih-I
Published in 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (19.04.2021)
Published in 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (19.04.2021)
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Conference Proceeding
Threshold voltage controlled by gate area and gate recess in inverted trapezoidal trigate AlGaN/GaN MOS high-electron-mobility transistors with photoenhanced chemical and plasma-enhanced atomic layer deposition oxides
Yeh, Po-Chun, Lin, Yun-Wei, Huang, Yue-Lin, Hung, Jui-Hung, Lin, Bo-Ren, Yang, Lucas, Wu, Cheng-Han, Wu, Tzu-Kuan, Wu, Chao-Hsin, Peng, Lung-Han
Published in Applied physics express (01.08.2015)
Published in Applied physics express (01.08.2015)
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Journal Article
Layer-dependent third-harmonic generation in multilayer graphene
Honghua Guan, Hao Yang, Po-Chun Yeh, Arefe, Ghidewon, Dadap, Jerry I., Hone, James, Osgood, Richard M.
Published in 2016 Conference on Lasers and Electro-Optics (CLEO) (01.06.2016)
Published in 2016 Conference on Lasers and Electro-Optics (CLEO) (01.06.2016)
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Conference Proceeding
Modeling of GaN HEMTs on silicon with trapping and self-heating effects for RF applications
Tsou, Chuan-Wei, Tu, Po-Tsung, Tsai, Kan-Hsueh, Yeh, Po-Chun, Lee, Heng-Yuan, Lee, Li-Heng, Hsu, Shawn S. H.
Published in 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2018)
Published in 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2018)
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Conference Proceeding
Optical third-harmonic microscopy of graphene
Dadap, Jerry I., Sung-Young Hong, Petrone, Nicholas, Po Chun Yeh, Hone, James, Osgood, Richard M.
Published in CLEO: 2013 (01.06.2013)
Published in CLEO: 2013 (01.06.2013)
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Conference Proceeding
Effects of Channel Thickness on DC/RF Performance of InAlGaN/AlN/GaN HEMTs
Shieh, De, Lee, Zheng-Fong, Lee, Ming-Yuan, Chen, Hui-Yu, Hsieh, Chang-Yan, Tu, Po-Tsung, Yeh, Po-Chun, Sheu, Shyh-Shyuan, Lo, Wei-Chung, Chang, Shih-Chieh, Shen, Chang-Hong, Shieh, Jia-Min, Chyi, Jen-Inn
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
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Conference Proceeding
Effect of Passivation on BEOL-Compatible Oxide Semiconductor Transistor
Kuo, Chi-Yuan, Lo, Tsung-Tien, Chiu, Yun-Ping, Lin, Wei-Chen, Liao, Hsien-Yi, Tsai, Chi-Hang, Lu, Sheng-Chia, Chen, Hsin-Chu, Huang, Haw-Tyng, Yeh, Po-Chun, Wu, Yuh-Renn, Wu, Chih-I
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
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Conference Proceeding