Improved trade-off characteristics of 3.3kV fast recovery diode with optimized carrier distribution used for power systems
Liu Yueyang, Jin Rui, Wu Di, He Yanqiang, Xu Zhe, He Feng, Dong Shaohua, Wen Jialiang, Zhao Yan, Pan Yan
Published in 2017 International Conference on Circuits, Devices and Systems (ICCDS) (01.09.2017)
Published in 2017 International Conference on Circuits, Devices and Systems (ICCDS) (01.09.2017)
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Conference Proceeding
Research on the failure property of VDMOS device by thermal cycles
Yin Jinghua, Hua Qing, He Yanqiang, Cao Yijiang, Chen Minghua, Liu Ting, Liu Xiaowei
Published in 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2011)
Published in 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2011)
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Conference Proceeding
The failure of VDMOS device caused by the mismatch of coefficient of thermal expansion
Yin Jinghua, Xu Dan, Hua Qing, He Yanqiang, Song Mingxin, Cao Yijiang
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
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Conference Proceeding
Intelligent petroleum pipeline defect detection method, system, equipment and medium
YAMANAMI, WU GUYONG, HU SHAOPING, FAN XIAOHONG, DU CHENGGANG, HE YANQIANG
Year of Publication 22.03.2024
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Year of Publication 22.03.2024
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