Voltage choosing of OBIRCH for finger metal structure
LinMeng Yang, Chan, Bobby, Gang Qian, LiLung Lai, Rui Fang
Published in 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2016)
Published in 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2016)
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