Electrical Characteristics and Thermal Stability of [Formula Omitted] Metal Gate Electrode for Advanced MOS Devices
Chang-Ta Yang, Chang-Ta Yang, Kuei-Shu Chang-Liao, Kuei-Shu Chang-Liao, Hsin-Chun Chang, Hsin-Chun Chang, Chung-Hao Fu, Chung-Hao Fu, Tien-Ko Wang, Tien-Ko Wang, Wen-Fa Tsai, Wen-Fa Tsai, Chi-Fong Ai, Chi-Fong Ai, Wen-Fa Wu, Wen-Fa Wu
Published in IEEE transactions on electron devices (01.11.2008)
Published in IEEE transactions on electron devices (01.11.2008)
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Journal Article
SEMICONDUCTOR MEMORY STRUCTURE
SU HSIN WEN, LIM KIAN LONG, YANG CHANG TA, LIN SHIH HAO, KENG WEN CHUN
Year of Publication 13.10.2021
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Year of Publication 13.10.2021
Patent
Electrical Characteristics and Thermal Stability of hbox Hf x hbox Ta y hbox Si z hbox N Metal Gate Electrode for Advanced MOS Devices
Yang, Chang-Ta Yang, Chang-Liao, Kuei-Shu, Chang, Hsin-Chun, Fu, Chung-Hao, Wang, Tien-Ko, Tsai, Wen-Fa, Ai, Chi-Fong, Wu, Wen-Fa
Published in IEEE transactions on electron devices (01.01.2008)
Published in IEEE transactions on electron devices (01.01.2008)
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Journal Article
SRAMSRAM HAVING IRREGULARLY SHAPED METAL LINES
LIN YU KUAN, WANG PING WEI, YANG CHANG TA, CHANG CHAO YUAN, CHEN JUI LIN
Year of Publication 26.03.2021
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Year of Publication 26.03.2021
Patent
Electrical Characteristics and Thermal Stability of \hbox\hbox\hbox\hbox Metal Gate Electrode for Advanced MOS Devices
Yang, Chang-Ta, Chang-Liao, Kuei-Shu, Chang, Hsin-Chun, Fu, Chung-Hao, Wang, Tien-Ko, Tsai, Wen-Fa, Ai, Chi-Fong, Wu, Wen-Fa
Published in IEEE transactions on electron devices (01.11.2008)
Published in IEEE transactions on electron devices (01.11.2008)
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Journal Article
Development of a Multiplayer Online Role-Playing Game-based Learning System for Multiple Curriculums
Kuo-Yu Liu, Chang-Ta Yang, Kuei-Hsiang Chang
Published in 2012 IEEE Fourth International Conference On Digital Game And Intelligent Toy Enhanced Learning (01.03.2012)
Published in 2012 IEEE Fourth International Conference On Digital Game And Intelligent Toy Enhanced Learning (01.03.2012)
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Conference Proceeding
Electrical Characteristics and Thermal Stability of HfxTaySizN Metal Gate Electrode for Advanced MOS Devices
YANG, Chang-Ta, CHANG-LIAO, Kuei-Shu, CHANG, Hsin-Chun, FU, Chung-Hao, WANG, Tien-Ko, TSAI, Wen-Fa, AI, Chi-Fong, WU, Wen-Fa
Published in IEEE transactions on electron devices (01.11.2008)
Published in IEEE transactions on electron devices (01.11.2008)
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Journal Article