The Operation Algorithm for Improving the Reliability of TLC (Triple Level Cell) NAND Flash Characteristics
Dong Wook Lee, Sunghoon Cho, Byung Woo Kang, Sukkwang Park, Byoungjun Park, Myoung Kwan Cho, Kun-Ok Ahn, Ye Seok Yang, Sung Wook Park
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
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Conference Proceeding
A Low Power Digital DLL with Wide Locking Range for 3Gbps 512Mb GDDR3 SDRAM
Won-Joo Yun, Hyun-Woo Lee, Young-Ju Kim, Won-Jun Choi, Sang-Hoon Shin, Hyang-Hwa Choi, Hyeng-Ouk Lee, Shin-Deok Kang, Hyong-Uk Moon, Seung-Wook Kwack, Dong-Uk Lee, Jung-Woo Lee, Young-Kyoung Choi, Nak-Kyu Park, Ki-Chang Kwean, Kwan-Weon Kim, Young-Jung Choi, Jin-Hong Ahn, Joong-Sik Kih, Ye-Seok Yang
Published in 2006 IEEE Asian Solid-State Circuits Conference (01.11.2006)
Published in 2006 IEEE Asian Solid-State Circuits Conference (01.11.2006)
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Conference Proceeding
A 0.1-to-1.5GHz 4.2mW All-Digital DLL with Dual Duty-Cycle Correction Circuit and Update Gear Circuit for DRAM in 66nm CMOS Technology
Yun, Won-Joo, Lee, Hyun Woo, Shin, Dongsuk, Kang, Shin Deok, Yang, Ji Yeon, Lee, Hyeng Ouk, Lee, Dong Uk, Sim, Sujeong, Kim, Young Ju, Choi, Won Jun, Song, Keun Soo, Shin, Sang Hoon, Choi, Hyang Hwa, Moon, Hyung Wook, Kwack, Seung Wook, Lee, Jung Woo, Choi, Young Kyoung, Park, Nak Kyu, Kim, Kwan Weon, Choi, Young Jung, Ahn, Jin-Hong, Yang, Ye Seok
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)
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Conference Proceeding
Multi-Slew-Rate Output Driver and Optimized Impedance-Calibration Circuit for 66nm 3.0Gb/s/pin DRAM Interface
Lee, Dong Uk, Kang, Shin Deok, Park, Nak Kyu, Lee, Hyun Woo, Choi, Young Kyoung, Lee, Jung Woo, Kwack, Seung Wook, Lee, Hyeong Ouk, Yun, Won Joo, Shin, Sang Hoon, Kim, Kwan Weon, Choi, Young Jung, Yang, Ye Seok
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)
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Conference Proceeding
MOSFET HAVING LDD STRUCTURE FOR PREVENTING DRAIN JUNCTION LEAKAGE
YANG, JUNG SEOP, BAEK, DONG WON, KIM, SE JEONG, YOON, GYEONG IL, YANG, YE SEOK
Year of Publication 27.08.2002
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Year of Publication 27.08.2002
Patent
METHOD OF FORMING AN ELEMENT ISOLATION OXIDE FILM IN A SEMICONDUCTOR DEVICE
JEONG, KWANG-YONG, HAN, U-SIK, KIM, YEONG-TAE, PAK, IN-OK, LEE, CHANG-GWEON, YANG, YE-SEOK, LEE, JU-SEOK
Year of Publication 01.12.1999
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Year of Publication 01.12.1999
Patent