Anomalous Negative Bias Temperature Instability Degradation Induced by Source/Drain Bias in Nanoscale PMOS Devices
Baoguang Yan, Jingfeng Yang, Zhiliang Xia, Xiaoyan Liu, Gang Du, Ruqi Han, Jinfeng Kang, Liao, C.C., Zhenghao Gan, Miao Liao, Wang, J.P., Waisum Wong
Published in IEEE transactions on nanotechnology (01.07.2008)
Published in IEEE transactions on nanotechnology (01.07.2008)
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Journal Article
Reliability Simulation and Design Consideration of High Speed ADC Circuits
Baoguang Yan, Jin Qin, Jun Dai, Qingguo Fan, Bernstein, J.B.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
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Conference Proceeding
Study of Transistor and Product NBTI Lifetime Distributions
Jin Qin, Baoguang Yan, Shoshany, Y., Roy, D., Rahamim, H., Marom, H., Bernstein, J.B.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
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Conference Proceeding
Reliability Simulation and Circuit-Failure Analysis in Analog and Mixed-Signal Applications
Baoguang Yan, Qingguo Fan, Bernstein, J.B., Jin Qin, Jun Dai
Published in IEEE transactions on device and materials reliability (01.09.2009)
Published in IEEE transactions on device and materials reliability (01.09.2009)
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Magazine Article
Study of Transistor and Product NBTI Lifetime Distributions
Qin, Jin, Yan, Baoguang, Shoshany, Yossi, Roy, Druker, Rahamim, Hezi, Marom, Haim, Bernstein, Joseph B.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
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Conference Proceeding