Structural Change of the Pt/C Electrocatalyst in Humidified Air Observed by In Situ TEM
Shimizu, Takahiro, Imamura, Daichi, Yaguchi, Toshie, Kanemura, Takashi, Kamino, Takeo
Published in ECS transactions (15.03.2013)
Published in ECS transactions (15.03.2013)
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Nucleation and growth of nanocrystalline silicon studied by TEM, XPS and ESR
Sato, Keisuke, Izumi, Tomio, Iwase, Mitsuo, Show, Yoshiyuki, Morisaki, Hiroshi, Yaguchi, Toshie, Kamino, Takeo
Published in Applied surface science (30.06.2003)
Published in Applied surface science (30.06.2003)
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Boron Observation in p-Type Silicon Device by Spherical Aberration Corrected Scanning Transmission Electron Microscope
Asayama, Kyoichiro, Hashikawa, Naoto, Kajiwara, Kazuto, Yaguchi, Toshie, Konno, Mitsuru, Mori, Hirotaro
Published in Applied physics express (01.07.2008)
Published in Applied physics express (01.07.2008)
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Observing and Modeling the Sequential Pairwise Reactions that Drive Solid‐State Ceramic Synthesis
Miura, Akira, Bartel, Christopher J., Goto, Yosuke, Mizuguchi, Yoshikazu, Moriyoshi, Chikako, Kuroiwa, Yoshihiro, Wang, Yongming, Yaguchi, Toshie, Shirai, Manabu, Nagao, Masanori, Rosero‐Navarro, Nataly Carolina, Tadanaga, Kiyoharu, Ceder, Gerbrand, Sun, Wenhao
Published in Advanced materials (Weinheim) (01.06.2021)
Published in Advanced materials (Weinheim) (01.06.2021)
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Advantages of Low-kV TEM in the Study of Beam Sensitive Materials
Yaguchi, Toshie, Kilcrease, Jim, Igarashi, Keisuke, Wakui, Akiko, Tamura, Keiji
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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