Electron microscope and imaging method
Tamura, Keiji, Kasai, Hiroto, Tamaki, Hirokazu, Harada, Ken, Taniguchi, Yoshifumi, Yotsuji, Takafumi, Yaguchi, Toshie
Year of Publication 14.01.2020
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Year of Publication 14.01.2020
Patent
ELECTRON MICROSCOPE AND IMAGING METHOD
TANIGUCHI, Yoshifumi, HARADA, Ken, KASAI, Hiroto, TAMAKI, Hirokazu, YOTSUJI, Takafumi, YAGUCHI, Toshie, TAMURA, Keiji
Year of Publication 02.05.2019
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Year of Publication 02.05.2019
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Electron microscope observation of thermal pre-treatment and vaporization processes of Ag–Sb and Pd–Sb systems in graphite furnace atomic absorption spectrometry
Yasuda, Kazuo, Yamamoto, Kazuko, Yaguchi, Toshie, Uchino, Kouichi, Hirokawa, Kichinosuke
Published in Spectrochimica acta. Part B: Atomic spectroscopy (31.12.1999)
Published in Spectrochimica acta. Part B: Atomic spectroscopy (31.12.1999)
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Charged Particle Beam Device and Sample Observation Method
TAMAKI Hirokazu, HANAWA Akinari, WATANABE Keitaro, YAGUCHI Toshie, DOBASHI Takashi, KIKUCHI Hideki, TANIGUCHI Yoshifumi
Year of Publication 15.03.2018
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Year of Publication 15.03.2018
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Development of a technique for in situ high temperature TEM observation of catalysts in a highly moisturized air atmosphere
Yaguchi, Toshie, Kanemura, Takashi, Shimizu, Takahiro, Imamura, Daichi, Watabe, Akira, Kamino, Takeo
Published in Journal of electron microscopy (01.08.2012)
Published in Journal of electron microscopy (01.08.2012)
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