Device-Aware Test for Ion Depletion Defects in RRAMs
Xun, Hanzhi, Yuan, Sicong, Fieback, Moritz, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Characterization and Test of Intermittent Over RESET in RRAMs
Xun, Hanzhi, Fieback, Moritz, Yuan, Sicong, Aziza, Hassen, Heidekamp, Mathijs, Copetti, Thiago, Poehls, Leticia Bolzani, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)
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Conference Proceeding
Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Yuan, Sicong, Taouil, Mottaqiallah, Fieback, Moritz, Xun, Hanzhi, Marinissen, Erik Jan, Kar, Gouri Sankar, Rao, Sidharth, Couet, Sebastien, Hamdioui, Said
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
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Conference Proceeding
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs
Xun, Hanzhi, Fieback, Moritz, Yuan, Sicong, Zhang, Ziwei, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2023 IEEE European Test Symposium (ETS) (22.05.2023)
Published in 2023 IEEE European Test Symposium (ETS) (22.05.2023)
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Conference Proceeding
Design-for-Test for Intermittent Faults in STT-MRAMs
Yuan, Sicong, Yaldagard, Mohammad Amin, Xun, Hanzhi, Fieback, Moritz, Marinissen, Erik Jan, Kim, Woojin, Rao, Siddharth, Couet, Sebastien, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
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Conference Proceeding
Online Detection of Unique Faults in RRAMs
Xun, Hanzhi, Fieback, Moritz, Yaldagard, Mohammad Amin, Yuan, Sicong, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
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Conference Proceeding
Device-Aware Diagnosis for Yield Learning in RRAMs
Xun, Hanzhi, Fieback, Moritz, Yuan, Sicong, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) (25.03.2024)
Published in 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) (25.03.2024)
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Conference Proceeding