Precipitation trend–Elevation relationship in arid regions of the China
Yao, Junqiang, Yang, Qing, Mao, Weiyi, Zhao, Yong, Xu, Xinbing
Published in Global and planetary change (01.08.2016)
Published in Global and planetary change (01.08.2016)
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Journal Article
Bimetallic metal-organic framework-modified resin for enhanced removal of organophosphorus: Inherent defects and high selectivity
Huang, Xiayu, Wang, Ruoding, Chen, Yanqi, Xu, Xinbing, Deng, Shanshan, Yin, Zhonglong, Dai, Yong, Yang, Weiben
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (01.11.2024)
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (01.11.2024)
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Journal Article
Electrically driven enhancement on selective adsorption of nitrate by microporous carbon from wastewater: Synergism of functional groups and micropores
Ge, Yu, Wang, Yue, Chen, Yanqi, Xu, Xinbing, Liu, Zifan, Yin, Zhonglong, Dai, Yong, Liu, Fuqiang, Yang, Weiben
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (01.09.2024)
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (01.09.2024)
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Journal Article
Degradation mechanism analysis for SiC power MOSFETs under repetitive power cycling stress
Rao, Yunliang, Chen, Yuan, He, Zhiyuan, Chen, Yiqiang, Liu, Chang, Xu, Xinbing, Liu, Yang, Lu, Guoguang
Published in Journal of physics. D, Applied physics (03.03.2022)
Published in Journal of physics. D, Applied physics (03.03.2022)
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Journal Article
Degradation Behavior and Defect Analysis for SiC Power MOSFETs Based on Low-Frequency Noise Under Repetitive Power-Cycling Stress
Yang, Xiaodong, Chen, Y. Q., Hou, Bo, Xu, Xinbing, Wang, Jingliang, Huang, Yun, Chen, Qiang, Zhou, Changjian
Published in IEEE transactions on electron devices (01.02.2021)
Published in IEEE transactions on electron devices (01.02.2021)
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Journal Article
Degradation assessment of 1.2-kV SiC MOSFETs and comparative study with 1.2-kV Si IGBTs under power cycling
Chen, Yuan, Huang, Hong-Zhong, Rao, Yunliang, He, Zhiyuan, Lai, Ping, Chen, Yiqiang, Xu, Xinbing, Liu, Chang
Published in Microelectronics and reliability (01.05.2022)
Published in Microelectronics and reliability (01.05.2022)
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Journal Article
A High Reverse Breakdown Voltage p-GaN Gate HEMT with Field Control Drain
Xing, Pengcheng, Wang, Fangzhou, Luo, Pan, Sun, Ruize, Shi, Yijun, Xu, Xinbing, Chen, Yiqiang, Chen, Wanjun
Published in ECS journal of solid state science and technology (01.08.2022)
Published in ECS journal of solid state science and technology (01.08.2022)
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Journal Article
Degradation behavior and mechanism of SiC power MOSFETs by total ionizing dose irradiation under different gate voltages
Gao, Kexin, Chen, Yiqiang, Zheng, Shuaizhi, Liao, Min, Xu, Xinbing, Lu, Meng
Published in 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) (25.08.2021)
Published in 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) (25.08.2021)
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Conference Proceeding
A Quantization Model Based on a Floating-point Computing-in-Memory Architecture
Chen, Xi, Guo, An, Xu, Xinbing, Si, Xin, Yang, Jun
Published in 2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (11.11.2022)
Published in 2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (11.11.2022)
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Conference Proceeding
Image Segmentation of Throat Swab Sampling Based on Mask R-CNN
Xu, Xinbing, Yang, Yongming, Zhou, Yuanyuan, Cui, Huanqi, Li, Shaoqiang, Guo, Wenliang, Li, Shiyue, Liu, Hao
Published in 2020 Chinese Automation Congress (CAC) (06.11.2020)
Published in 2020 Chinese Automation Congress (CAC) (06.11.2020)
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Conference Proceeding
Effect of artmether,hemin and Fe3+ on recombinant lactate dehydrogenase from Schistosoma japonicum
Lu, Gang, Hu, Xuchu, Huang, Can, Lu, Yajun, Wu, Lixian, Li, Lihua, Xu, Jing, Yu, Xinbing
Published in Asian Pacific journal of tropical medicine (01.12.2010)
Published in Asian Pacific journal of tropical medicine (01.12.2010)
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Journal Article