Improved Single-Event Transient Hardness in Tunnel-Diode Body-Contact SOI nMOS
Lingda Xu, Jiexin Luo, Jing Chen, Zhan Chai, He, Weiwei, En Xia Zhang, Fleetwood, Daniel M.
Published in IEEE transactions on nuclear science (01.10.2017)
Published in IEEE transactions on nuclear science (01.10.2017)
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Journal Article
Process Synthesis: Selective Recovery of Lithium from Lithium-Ion Battery Cathode Materials
Li, Quan, Fung, Ka Yip, Xu, Lingda, Wibowo, Christianto, Ng, Ka Ming
Published in Industrial & engineering chemistry research (27.02.2019)
Published in Industrial & engineering chemistry research (27.02.2019)
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Journal Article
Compact Model for Tunnel Diode Body Contact SOI n-MOSFETs
Chang, Yongwei, Luo, Jiexin, Chen, Jing, Xu, Lingda, Chai, Zhan, Wang, Shuo, Dong, Yemin, Wang, Xi
Published in IEEE transactions on electron devices (01.01.2019)
Published in IEEE transactions on electron devices (01.01.2019)
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Journal Article
Comparing the TID-induced RF performance degradation of floating body and body contacted 130 nm SOI NMOS transistors
Ge, Hao, Zhang, En Xia, Chen, Jing, Xu, Lingda, Wang, Shuo, Chai, Zhan, Wang, Pan, Fleetwood, Daniel M.
Published in Microelectronics and reliability (01.01.2020)
Published in Microelectronics and reliability (01.01.2020)
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