On-orbit error rate multimode verification method, medium and equipment
ZHENG HONGCHAO, XU LEIPEI, DONG TAO, LI ZHE, ZHANG JIANPENG, ZHANG YANLONG, HUANG SICHONG, WANG LIANG, GOU CHUNLIANG, BI XIAO
Year of Publication 30.07.2024
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Year of Publication 30.07.2024
Patent
Low-energy proton single-particle on-orbit error rate evaluation method
ZHENG HONGCHAO, XU LEIPEI, DONG TAO, WANG YONGPING, LI ZHE, ZHANG JIANPENG, WANG HUANGWEI, HUANG SICHONG, WANG LIANG, GOU CHUNLIANG, ZHAO YUANFU
Year of Publication 05.12.2023
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Year of Publication 05.12.2023
Patent
Multi-configuration single-particle bit error rate prediction method for high-speed serial bus
ZHENG HONGCHAO, XU LEIPEI, DONG TAO, WANG YONGPING, LI ZHE, ZHANG JIANPENG, ZHANG YANLONG, ZHANG XUE, HUANG SICHONG, WANG LIANG, GOU CHUNLIANG, BI XIAO
Year of Publication 25.06.2024
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Year of Publication 25.06.2024
Patent
High-frequency signal single-particle transient detection method based on time interleaving
ZHENG HONGCHAO, XU LEIPEI, DONG TAO, LI ZHE, ZHANG JIANPENG, ZHANG XUE, WU YONGJUN, WANG LIANG, GOU CHUNLIANG, BI XIAO
Year of Publication 02.06.2023
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Year of Publication 02.06.2023
Patent
Electronic total dose test method based on checkerboard
ZHENG HONGCHAO, ZHANG JIANPENG, WANG LIANG, HUANG SICHONG, ZHAO YUANFU, ZHOU TAO, XU LEIPEI, DONG TAO, LIU YAJIAO, LI ZHE, WANG HUANGWEI, GOU CHUNLIANG, BI XIAO
Year of Publication 19.01.2024
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Year of Publication 19.01.2024
Patent
Method and system for evaluating single event upset of memory in integrated circuit chip
ZHENG HONGCHAO, XU LEIPEI, DONG TAO, LI ZHE, ZHANG JIANPENG, ZHANG XUE, WU YONGJUN, HUANG SICHONG, WANG LIANG, GOU CHUNLIANG, BI XIAO
Year of Publication 01.08.2023
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Year of Publication 01.08.2023
Patent
Total dose general test system and method
XU LEIPEI, ZHENG HONGCHAO, DONG TAO, ZHANG JIANPENG, LI ZHE, YU CHUNQING, WU YONGJUN, WANG HUANGWEI, WANG LIANG, GOU CHUNLIANG, BI XIAO, ZHANG XUSHEN
Year of Publication 23.06.2023
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Year of Publication 23.06.2023
Patent
Single-particle error evaluation system and method for high-speed DDR (Double Data Rate) memory
ZHENG HONGCHAO, XU LEIPEI, DONG TAO, LI ZHE, ZHANG JIANPENG, WU YONGJUN, WANG LIANG, GOU CHUNLIANG, ZHANG XU, BI XIAO
Year of Publication 30.08.2022
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Year of Publication 30.08.2022
Patent
Method for estimating reference interval of on-orbit single event upset rate of device
ZHENG HONGCHAO, XU LEIPEI, CHEN LEI, DONG TAO, LI ZHE, ZHANG JIANPENG, WANG HUANGWEI, WU YONGJUN, WANG LIANG, GOU CHUNLIANG, ZHANG XU, BI XIAO
Year of Publication 29.04.2022
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Year of Publication 29.04.2022
Patent
Simulation test method for instantaneous dose rate effect of module-level circuit
ZHENG HONGCHAO, ZHANG JIANPENG, LI TONGDE, WU YONGJUN, WANG LIANG, ZHAO YUANFU, ZHU YONGQIN, XU LEIPEI, LI ZHE, YU CHUNQING, ZHANG XUE, YUE SUGE, PENG HUIXIN, BI XIAO, ZHANG XUSHEN
Year of Publication 04.12.2020
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Year of Publication 04.12.2020
Patent
Automatic single particle irradiation test control system and method
ZHENG HONGCHAO, XU LEIPEI, ZHAO XU, LI ZHE, YU CHUNQING, DONG FANGLEI, MU LILONG, WU YONGJUN, BI XIAO, PENG HUIXIN, DU SHOUGANG, ZHANG XUSHEN
Year of Publication 02.08.2019
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Year of Publication 02.08.2019
Patent
Anti-radiation hardening module-level circuit simulation test method
ZHENG HONGCHAO, WU YONGJUN, WANG LIANG, LI JIANCHENG, XU LEIPEI, ZHAO XU, LI ZHE, YU CHUNQING, CHU FEI, YUE SUGE, MU LILONG, PENG HUIXIN, BI XIAO
Year of Publication 14.04.2020
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Year of Publication 14.04.2020
Patent
Testing system and method of JESD204B protocol high-speed sender single-particle error rate
ZHENG HONGCHAO, BIAN QIANG, WU YONGJUN, XU LEIPEI, ZHAO XU, CHEN MAOXIN, SONG XIAOJING, LI ZHE, YU CHUNQING, DONG FANGLEI, MU LILONG, BI XIAO, PENG HUIXIN, DU SHOUGANG, ZHANG XUSHEN
Year of Publication 16.04.2019
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Year of Publication 16.04.2019
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Single-particle transient effect evaluation method and system for high-speed digital-to-analog conversion circuit
ZHENG HONGCHAO, LI YUE, WU YONGJUN, JIAN GUIZHOU, LI JIANCHENG, XU LEIPEI, ZHAO XU, LI ZHE, YU CHUNQING, DONG FANGLEI, MU LILONG, PENG HUIXIN, BI XIAO, DU SHOUGANG, ZHANG XUSHEN
Year of Publication 05.04.2019
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Year of Publication 05.04.2019
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Single particle effect test method, device and system and electronic device of visual information processing circuit
ZHENG HONGCHAO, LI JIANCHENG, WANG FUQING, XU LEIPEI, ZHAO XU, LI ZHE, YU CHUNQING, CHU FEI, DONG FANGLEI, YUE SUGE, MU LILONG, TAO HUIBIN, BI XIAO, PENG HUIXIN, DU SHOUGANG
Year of Publication 05.04.2019
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Year of Publication 05.04.2019
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