by Amrouch, H., Anders, J., Becker, S., Betka, M., Bleher, G., Domanski, P., Elhamawy, N., Ertl, T., Gatzastras, A., Genssler, P., Hasler, S., Heinrich, M., van Hoorn, A., Jafarzadeh, H., Kallfass, I., Klemme, F., Koch, S., Kusters, R., Lalama, A., Latty, R., Liao, Y., Lylina, N., Haghi, Z. Najafi, Pfluger, D., Polian, I., Rivoir, J., Sauer, M., Schwachhofer, D., Templin, S., Volmer, C., Wagner, S., Weiskopf, D., Wunderlich, H.-J., Yang, B., Zimmermann, M.
Published in 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) (14.03.2022)

by Asada, K., Wen, X., Holst, S., Miyase, K., Kajihara, S., Kochte, M. A., Schneider, E., Wunderlich, H.-J, Qian, J.
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)

by Yuyi Tang, Wunderlich, H.-J., Piet Engelke, Polian, I., Becker, B., Schloffel, J., Hapke, F., Wittke, M.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2006)

by Tran, D. A., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovich, S., Wunderlich, H.–J.
Published in Journal of electronic testing (01.08.2014)

by Hongyan Zhang, Kochte, Michael A., Imhof, Michael E., Bauer, Lars, Wunderlich, H-J, Henkel, Jorg
Published in 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) (01.06.2014)

by GHERMAN, V, WUNDERLICH, H.-J, SCHLOEFFEL, J, GARBERS, M
Published in IET computers & digital techniques (01.05.2007)

by Hellebrand, S., Wunderlich, H.-J., Ivaniuk, A.A., Klimets, Y.V., Yarmolik, V.N.
Published in IEEE transactions on computers (01.07.2002)

by Kiefer, G., Vranken, H., Marinissen, E.J., Wunderlich, H.-J.
Published in Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) (2000)

by Stroele, A.P., Wunderlich, H.-J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.1998)

by Wunderlich, H.-J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.1990)

by Gerstendorfer, S., Wunderlich, H.-J.
Published in International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) (1999)

by Vranken, H., Sapei, F.S., Wunderlich, H.-J.
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition (2004)

by Strole, A.P., Wunderlich, H.-J.
Published in IEEE journal of solid-state circuits (01.07.1991)

by Wunderlich, H.-J., Hellebrand, S.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1992)

by Tran, D. A., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Wunderlich, H.
Published in 2011 Asian Test Symposium (01.11.2011)

by Tran, D. A., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Todri, A., Imhof, M. E., Wunderlich, H.
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)

by Eschermann, B., Wunderlich, H.-J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.1992)

by Tran, D A, Virazel, A, Bosio, A, Dilillo, L, Girard, P, Pravossoudovitch, S, Wunderlich, H
Published in 2010 IEEE International Test Conference (01.11.2010)

by Yarmolik, V.N., Hellebrand, S., Wunderlich, H.-J.
Published in Proceedings Design, Automation and Test in Europe (1998)

by Hellebrand, S., Wunderlich, H.-J., Ivaniuk, A., Klimets, Y., Yarmolik, V.N.
Published in Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) (1999)