Contouring Control of Smooth Paths for Multiaxis Motion Systems Based on Equivalent Errors
CHEN, Shyh-Leh, WU, Kai-Chiang
Published in IEEE transactions on control systems technology (01.11.2007)
Published in IEEE transactions on control systems technology (01.11.2007)
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Journal Article
Reliability Engineering in a Time of Rapidly Converging Technologies
Shieh, Shiuhpyng Winston, Voas, Jeff, Laplante, Phil, Rupe, Jason, Hansen, Christian, Wu, Yu-Sung, Chen, Yi-Ting, Li, Chi-Yu, Wu, Kai-Chiang
Published in IEEE transactions on reliability (01.03.2024)
Published in IEEE transactions on reliability (01.03.2024)
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Journal Article
CNN-Based Stochastic Regression for IDDQ Outlier Identification
Yen, Chia-Heng, Chen, Chun-Teng, Wen, Cheng-Yen, Chen, Ying-Yen, Lee, Jih-Nung, Kao, Shu-Yi, Wu, Kai-Chiang, Chao, Mango Chia-Tso
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2023)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2023)
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Journal Article
Methodology of Generating Timing-Slack-Based Cell-Aware Tests
Nien, Yu-Teng, Wu, Kai-Chiang, Lee, Dong-Zhen, Chen, Ying-Yen, Chen, Po-Lin, Chern, Mason, Lee, Jih-Nung, Kao, Shu-Yi, Chao, Mango Chia-Tso
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2022)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2022)
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Journal Article
A Low-Cost, Systematic Methodology for Soft Error Robustness of Logic Circuits
Kai-Chiang Wu, Marculescu, D.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2013)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2013)
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Journal Article
Test Methodology for Defect-Based Bridge Faults
Chang, Shuo-Wen, Nien, Yu-Teng, Hu, Yu-Pang, Wu, Kai-Chiang, Wang, Chi-Chun, Huang, Fu-Sheng, Tang, Yi-Lun, Chen, Yung-Chen, Chen, Ming-Chien, Chao, Mango C.-T.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2022)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2022)
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Journal Article
FLORA: Fine-grained Low-Rank Architecture Search for Vision Transformer
Chang, Chi-Chih, Sung, Yuan-Yao, Yu, Shixing, Huang, Ning-Chi, Marculescu, Diana, Wu, Kai-Chiang
Published in 2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) (03.01.2024)
Published in 2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) (03.01.2024)
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Conference Proceeding
Highly Uniform All‐Vacuum‐Deposited Inorganic Perovskite Artificial Synapses for Reservoir Computing
Chen, Li-Wei, Wang, Wei-Chun, Ko, Shao-Han, Chen, Chien-Yu, Hsu, Chih-Ting, Chiao, Fu-Ching, Chen, Tse-Wei, Wu, Kai-Chiang, Lin, Hao-Wu
Published in Advanced intelligent systems (01.01.2021)
Published in Advanced intelligent systems (01.01.2021)
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Journal Article
Outlier Detection for Analog Tests Using Deep Learning Techniques
Lin, Chin-Kuan, Lu, Cheng-Che, Chang, Shuo-Wen, Chu, Ying-Hua, Wu, Kai-Chiang, Chao, Mango Chia-Tso
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
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Conference Proceeding
Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information
Liu, Ching-Min, Yen, Chia-Heng, Lee, Shu-Wen, Wu, Kai-Chiang, Chao, Mango Chia-Tso
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Power-Planning-Aware Soft Error Hardening via Selective Voltage Assignment
Kai-Chiang Wu, Marculescu, Diana
Published in IEEE transactions on very large scale integration (VLSI) systems (01.01.2014)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.01.2014)
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Journal Article
Test Generation for Defect-Based Faults of Scan Flip-Flops
Nien, Yu-Teng, Li, Chen-Hong, Wu, Pei-Yin, Wang, Yung-Jheng, Wu, Kai-Chiang, Chao, Mango C.-T.
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
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Conference Proceeding
Fast WAT test structure for measuring Vt variance based on latch-based comparators
Kao-Chi Lee, Kai-Chiang Wu, Chih-Ying Tsai, Chao, Mango Chia-Tso
Published in 2017 IEEE 35th VLSI Test Symposium (VTS) (01.04.2017)
Published in 2017 IEEE 35th VLSI Test Symposium (VTS) (01.04.2017)
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Conference Proceeding
Room-Temperature Fabricated Multilevel Nonvolatile Lead-Free Cesium Halide Memristors for Reconfigurable In-Memory Computing
Su, Tsung-Kai, Cheng, Wei-Kai, Chen, Cheng-Yueh, Wang, Wei-Chun, Chuang, Yung-Tang, Tan, Guang-Hsun, Lin, Hao-Cheng, Hou, Cheng-Hung, Liu, Ching-Min, Chang, Ya-Chu, Shyue, Jing-Jong, Wu, Kai-Chiang, Lin, Hao-Wu
Published in ACS nano (23.08.2022)
Published in ACS nano (23.08.2022)
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Journal Article
Power-aware soft error hardening via selective voltage scaling
Kai-Chiang Wu, Marculescu, D.
Published in 2008 IEEE International Conference on Computer Design (01.10.2008)
Published in 2008 IEEE International Conference on Computer Design (01.10.2008)
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Conference Proceeding
Using Path Features for Hardware Trojan Detection Based on Machine Learning Techniques
Yen, Chia-Heng, Tsai, Jung-Che, Wu, Kai-Chiang
Published in 2023 24th International Symposium on Quality Electronic Design (ISQED) (05.04.2023)
Published in 2023 24th International Symposium on Quality Electronic Design (ISQED) (05.04.2023)
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Conference Proceeding