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Built-in self test for multiple memories in a chip
by
Lee, Kuen-Jong
,
Wu
,
Jing
-
Yane
,
Jone, Wen-Ben
Year of Publication
19.03.2002
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Built-in self test for multiple memories in a chip
by
LEE KUEN-JONG
,
WU JING
-
YANE
,
JONE WEN-BEN
Year of Publication
19.03.2002
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Patent
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information storage
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