Asymmetric Electrode Structure Induces Dual-Channel Phenomenon under Hot-Carrier Stress in Organic Thin-Film Transistors
Tu, Yu-Fa, Huang, Jen-Wei, Chang, Ting-Chang, Hung, Yang-Hao, Lu, I-Nien, Zhou, Kuan-Ju, Sun, Li-Chuan, Chen, Yu-An, Wu, Chia-Chuan, Hung, Wei-Chieh, Lee, Jason, Lien, Chen-Hsin
Published in IEEE electron device letters (01.09.2023)
Published in IEEE electron device letters (01.09.2023)
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Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process
Wu, Chia-Chuan, Ma, William Cheng-Yu, Chang, Ting-Chang, Wang, Yu-Xuan, Tai, Mao-Chou, Tu, Yu-Fa, Chen, Yu-An, Tu, Hong-Yi, Chien, Ya-Ting, Chang, Han-Yu, Huang, Bo-Shen
Published in IEEE transactions on electron devices (01.03.2023)
Published in IEEE transactions on electron devices (01.03.2023)
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Journal Article
Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
Tu, Hong-Yi, Tsai, Tsung-Ming, Wu, Chia-Chuan, Tsao, Yu-Ching, Tai, Mao-Chou, Chang, Ting-Chang, Tsai, Yu-Lin, Huang, Shin-Ping, Zheng, Yu-Zhe, Wang, Yu-Xuan, Chen, Hong-Chih
Published in IEEE electron device letters (01.11.2019)
Published in IEEE electron device letters (01.11.2019)
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Journal Article
Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Huang, Shin-Ping, Chen, Hong-Chih, Chen, Po-Hsun, Zheng, Yu-Zhe, Chu, Ann-Kuo, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan, Chen, Yu-An, Sun, Pei-Jun, Huang, Hui-Chun, Lai, Wei-Chih, Chang, Ting-Chang
Published in IEEE transactions on electron devices (01.08.2020)
Published in IEEE transactions on electron devices (01.08.2020)
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Journal Article
Suppression of Edge Effect Induced by Positive Gate Bias Stress in Low-Temperature Polycrystalline Silicon TFTs With Channel Width Extension Over Source/Drain Regions
Wang, Yu-Xuan, Tai, Mao-Chou, Chang, Ting-Chang, Huang, Shin-Ping, Zheng, Yu-Zhe, Wu, Chia-Chuan, Shih, Yu-Shan, Chen, Yu-An, Sun, Pei-Jun, Lu, I-Nien, Huang, Hui-Chun, Sze, Simon M.
Published in IEEE transactions on electron devices (01.12.2020)
Published in IEEE transactions on electron devices (01.12.2020)
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Journal Article
Improvement of Strained Negative Bias Temperature Instability in Flexible LTPS TFTs by a Stress-Release Design
Wang, Yu-Xuan, Chang, Ting-Chang, Tai, Mao-Chou, Wu, Chia-Chuan, Zheng, Yu-Zhe, Tu, Yu-Fa, Chen, Jian-Jie, Zhou, Kuan-Ju, Shih, Yu-Shan, Chen, Yu-An, Huang, Jen-Wei, Sze, Simon
Published in IEEE transactions on electron devices (01.03.2022)
Published in IEEE transactions on electron devices (01.03.2022)
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Journal Article
Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions
Tu, Hong-Yi, Chang, Ting-Chang, Tsao, Yu-Ching, Tai, Mao-Chou, Zheng, Yu-Zhe, Tu, Yu-Fa, Kuo, Chuan-Wei, Wu, Chia-Chuan, Tsai, Yu-Lin, Tsai, Tsung-Ming, Lin, Chih-Chih, Chien, Ya-Ting
Published in IEEE electron device letters (01.05.2022)
Published in IEEE electron device letters (01.05.2022)
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Journal Article
Enhancing Reliability and 2 mm-Axial Mechanical Bending Endurance by Gate Insulator Improvements in Flexible Polycrystalline Silicon TFTs
Zheng, Yu-Zhe, Chen, Po-Hsun, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhou, Kuan-Ju, Tu, Yu-Fa, Wang, Yu-Xuan, Wu, Chia-Chuan, Chen, Yu-An, Sun, Pei-Jun, Chen, Juan-Jie, Tu, Hong-Yi, Hung, Yang-Hao, Lin, Yu-Shan, Ciou, Fong-Min, Shih, Yu-Shan, Huang, Hui-Chun
Published in IEEE transactions on electron devices (01.05.2022)
Published in IEEE transactions on electron devices (01.05.2022)
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Journal Article
Impact of AC Stress in Low Temperature Polycrystalline Silicon Thin Film Transistors Produced With Different Excimer Laser Annealing Energies
Zheng, Yu-Zhe, Wu, Chia-Chuan, Chen, Po-Hsun, Chang, Ting-Chang, Zhou, Kuan-Ju, Tu, Hong-Yi, Tu, Yu-Fa, Chen, Yu-An, Shih, Yu-Shan, Wang, Yu-Xuan, Sun, Pei-Jun, Hung, Yang-Hao, Tsai, Tsung-Ming
Published in IEEE electron device letters (01.06.2021)
Published in IEEE electron device letters (01.06.2021)
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Journal Article
Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Wang, Yu-Xuan, Chang, Ting-Chang, Tai, Mao-Chou, Wu, Chia-Chuan, Tu, Yu-Fa, Chen, Jian-Jie, Huang, Wei-Chen, Shih, Yu-Shan, Chen, Yu-An, Huang, Jen-Wei, Sze, Simon
Published in IEEE electron device letters (01.05.2021)
Published in IEEE electron device letters (01.05.2021)
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Analysis of Meridian Flow Direction by Electrical Stimulation Method
Liu, Yan-Wen, Kuo, Chuan-Wei, Chang, Ting-Chang, Hung, Yu-Chiang, Tan, Yung-Fang, Wu, Chia-Chuan, Lin, Chien-Hung, Chen, Wen-Chung, Hu, Wen-Long, Tsai, Tsung-Ming
Published in Nanoscale research letters (08.07.2022)
Published in Nanoscale research letters (08.07.2022)
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A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide
Wang, Yu-Xuan, Chang, Ting-Chang, Huang, Shin-Ping, Tai, Mao-Chou, Zheng, Yu-Zhe, Wu, Chia-Chuan, Shih, Yu-Shan, Chen, Yu-An, Tsai, Yu-Lin, Tu, Hong-Yi, Lu, I-Nien, Zhou, Kuan-Ju, Lin, Chih-Chih, Chu, Ann-Kuo, Sze, Simon
Published in IEEE electron device letters (01.05.2020)
Published in IEEE electron device letters (01.05.2020)
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Journal Article
Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTs
Zheng, Yu-Zhe, Huang, Shin-Ping, Chen, Po-Hsun, Chang, Ting-Chang, Tsai, Tsung-Ming, Chu, Ann-Kuo, Hung, Yang-Hao, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan, Tu, Yu-Fa, Chen, Yu-An, Sun, Pei-Jun, Chung, Yu-Hua, Chen, Wei-Han, Wang, Tai-Jui
Published in IEEE electron device letters (01.05.2020)
Published in IEEE electron device letters (01.05.2020)
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Journal Article
Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film Transistors
Huang, Shin-Ping, Chen, Po-Hsun, Chen, Hong-Chih, Zheng, Yu-Zhe, Chu, Ann-Kuo, Tsao, Yu-Ching, Shih, Yu-Shan, Wang, Yu-Xuan, Wu, Chia-Chuan, Lai, Wei-Chih, Chang, Ting-Chang
Published in IEEE electron device letters (01.10.2019)
Published in IEEE electron device letters (01.10.2019)
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G-quadruplex formation by single-base mutation or deletion of mitochondrial DNA sequences
Chu, I-Te, Wu, Chia-Chuan, Chang, Ta-Chau
Published in Biochimica et biophysica acta. General subjects (01.02.2019)
Published in Biochimica et biophysica acta. General subjects (01.02.2019)
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Protective effects of sesamin and sesamolin on murine BV-2 microglia cell line under hypoxia
Hou, Rolis Chien-Wei, Wu, Chia-Chuan, Yang, Chia-Hung, Jeng, Kee-Ching G
Published in Neuroscience letters (26.08.2004)
Published in Neuroscience letters (26.08.2004)
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Meridian study on the response current affected by acupuncture needling direction
Lin, Chien-Hung, Tan, Yung-Fang, Tseng, Shih-Ting, Chen, Wen-Chung, Kuo, Chuan-Wei, Wu, Chia-Chuan, Tsai, Tsung-Ming, Hu, Wen-Long, Chang, Ting-Chang, Hung, Yu-Chiang
Published in Medicine (Baltimore) (02.09.2022)
Published in Medicine (Baltimore) (02.09.2022)
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Nanonized black soybean enhances immune response in senescence-accelerated mice
Chan, Yin-Ching, Wu, Chia-Chuan, Chan, Kung-Chi, Lin, Yo-Giao, Liao, Jiunn-Wang, Wang, Ming-Fu, Chang, Yung-Ho, Jeng, Kee-Ching
Published in International journal of nanomedicine (01.01.2009)
Published in International journal of nanomedicine (01.01.2009)
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