Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)
Swift, G.M., Rezgui, S., George, J., Carmichael, C., Napier, M., Maksymowicz, J., Moore, J., Lesea, A., Koga, R., Wrobel, T.F.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article
Solutions to heavy ion induced avalanche burnout in power devices
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Conference Proceeding
Analysis of Transient Radiation Upset in a 2K SRAM
Massengill, L. W., Diehl-Nagle, S. E., Wrobel, T. F.
Published in IEEE transactions on nuclear science (01.12.1985)
Published in IEEE transactions on nuclear science (01.12.1985)
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Journal Article
A Radiation Hardened Nonvolatile MNOS RAM
Wrobel, T. F., Dodson, W. H., Hash, G. L., Jones, R. V., Nasby, R. D., Olson, R. J.
Published in IEEE transactions on nuclear science (01.01.1983)
Published in IEEE transactions on nuclear science (01.01.1983)
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Journal Article
Current Induced Avalanche in Epitaxial Structures
Wrobel, T. F., Coppage, F. N., Hash, G. L., Smith, A. J.
Published in IEEE transactions on nuclear science (01.12.1985)
Published in IEEE transactions on nuclear science (01.12.1985)
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Journal Article
MOS-Transistor Radiation Detectors and X-Ray Dose-Enhancement Effects
Posey, L. D., Wrobel, T. F., Evans, D. C., Beezhold, W., Kelly, J. G., MacCallum, C. J., Coppage, F. N., Luera, T. F., Lorence, L. J., Smith, A. J.
Published in IEEE transactions on nuclear science (01.12.1985)
Published in IEEE transactions on nuclear science (01.12.1985)
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Journal Article
Snap-Back: A Stable Regenerative Breakdown Mode of MOS Devices
Ochoa, A., Sexton, F. W., Wrobel, T. F., Hash, G. L., Sokel, R. J.
Published in IEEE transactions on nuclear science (01.01.1983)
Published in IEEE transactions on nuclear science (01.01.1983)
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Journal Article
MOS-transistor radiation detectors and X-ray dose-enhancement effects
Posey, L D, Wrobel, T F, Evans, D C, Beezhold, W, Kelly, J G
Published in IEEE transactions on nuclear science (01.12.1985)
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Published in IEEE transactions on nuclear science (01.12.1985)
Journal Article
Hard Error Generation by Neutron-Induced Fission Fragments
Browning, J. S., Gover, J. E., Wrobel, T. F., Hass, K. J., Nasby, R. D., Simpson, R. L., Posey, L. D., Boos, R. E., Block, R. C.
Published in IEEE transactions on nuclear science (01.12.1987)
Published in IEEE transactions on nuclear science (01.12.1987)
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Journal Article
Silicon solar cell damage from electrical overstress
Pease, R L, Barnum, J R, Vulliet, W G, VAN LINT, V A J, Wrobel, T F
Published in IEEE transactions on nuclear science (01.12.1982)
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Published in IEEE transactions on nuclear science (01.12.1982)
Journal Article
Radiation Testing of the CMOS 8085 Microprocessor Family
Sexton, F. W., Anderson, R. E., Corbett, W. T., Giddings, A. E., Jorgensen, J. L., Kim, W. S., Mnich, T. M., Nordstrom, T. V., Ochoa, A., Sobolewski, M. A., Treece, R. K., Wrobel, T. F.
Published in IEEE transactions on nuclear science (01.12.1983)
Published in IEEE transactions on nuclear science (01.12.1983)
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Journal Article