A flood vulnerability index for coastal cities and its use in assessing climate change impacts
Balica, S. F., Wright, N. G., van der Meulen, F.
Published in Natural hazards (Dordrecht) (01.10.2012)
Published in Natural hazards (Dordrecht) (01.10.2012)
Get full text
Journal Article
Recent advance in high manufacturing readiness level and high temperature CMOS mixed-signal integrated circuits on silicon carbide
Weng, M H, Clark, D T, Wright, S N, Gordon, D L, Duncan, M A, Kirkham, S J, Idris, M I, Chan, H K, Young, R A R, Ramsay, E P, Wright, N G, Horsfall, A B
Published in Semiconductor science and technology (25.04.2017)
Published in Semiconductor science and technology (25.04.2017)
Get full text
Journal Article
Radiometric Calibration of the Advanced Wind Scatterometer Radar ASCAT Carried Onboard the METOP-A Satellite
Wilson, J J W, Anderson, C, Baker, M A, Bonekamp, H, Saldaña, J Figa, Dyer, R G, Lerch, J A, Kayal, G, Gelsthorpe, R V, Brown, M A, Schied, E, Schutz-Munz, S, Rostan, F, Pritchard, E W, Wright, N G, King, D, Onel, Ü
Published in IEEE transactions on geoscience and remote sensing (01.08.2010)
Published in IEEE transactions on geoscience and remote sensing (01.08.2010)
Get full text
Journal Article
Direct numerical simulation of open-channel flow over a heterogeneous particle bed at low relative submergence
Sarwar, S., Akiki, G., Balachandar, S., Sleigh, P. A., Wright, N. G.
Published in Physics of fluids (1994) (01.08.2024)
Published in Physics of fluids (1994) (01.08.2024)
Get full text
Journal Article
Time accurate local time stepping for the unsteady shallow water equations
Crossley, A. J., Wright, N. G.
Published in International journal for numerical methods in fluids (10.07.2005)
Published in International journal for numerical methods in fluids (10.07.2005)
Get full text
Journal Article
Protection of selectively implanted and patterned silicon carbide surfaces with graphite capping layer during post-implantation annealing
Vassilevski, K V, Wright, N G, Nikitina, I P, Horsfall, A B, O'Neill, A G, Uren, M J, Hilton, K P, Masterton, A G, Hydes, A J, Johnson, C M
Published in Semiconductor science and technology (01.03.2005)
Published in Semiconductor science and technology (01.03.2005)
Get full text
Journal Article
Positive flatband voltage shift in phosphorus doped SiO2/N-type 4H-SiC MOS capacitors under high field electron injection
Idris, M I, Weng, M H, Peters, A, Siddall, R J, Townsend, N J, Wright, N G, Horsfall, A B
Published in Journal of physics. D, Applied physics (11.12.2019)
Published in Journal of physics. D, Applied physics (11.12.2019)
Get full text
Journal Article
A novel electrochemical device for the disinfection of fluids by OH radicals
Christensen, P A, Egerton, T A, Lin, W F, Meynet, P, Shao, Z-G, Wright, N G
Published in Chemical communications (Cambridge, England) (01.01.2006)
Published in Chemical communications (Cambridge, England) (01.01.2006)
Get more information
Journal Article
Device processing and characterisation of high temperature silicon carbide Schottky diodes
Vassilevski, K.V., Nikitina, I.P., Wright, N.G., Horsfall, A.B., O’Neill, A.G., Johnson, C.M.
Published in Microelectronic engineering (2006)
Published in Microelectronic engineering (2006)
Get full text
Journal Article
Conference Proceeding
Dose Rate Linearity in 4H-SiC Schottky Diode-Based Detectors at Elevated Temperatures
Mohamed, N. S., Wright, N. G., Horsfall, A. B.
Published in IEEE transactions on nuclear science (01.07.2017)
Published in IEEE transactions on nuclear science (01.07.2017)
Get full text
Journal Article
Structural pattern formation in titanium–nickel contacts on silicon carbide following high-temperature annealing
Nikitina, I P, Vassilevski, K V, Horsfall, A B, Wright, N G, O'Neill, A G, Johnson, C M, Yamamoto, T, Malhan, R K
Published in Semiconductor science and technology (01.07.2006)
Published in Semiconductor science and technology (01.07.2006)
Get full text
Journal Article
Direct measurement of residual stress in sub-micron interconnects
Horsfall, A B, Santos, J M M dos, Soare, S M, Wright, N G, O'Neill, A G, Bull, S J, Walton, A J, Gundlach, A M, Stevenson, J T M
Published in Semiconductor science and technology (01.11.2003)
Published in Semiconductor science and technology (01.11.2003)
Get full text
Journal Article