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Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
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Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans
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Published in IEEE transactions on industrial electronics (1982) (01.07.2020)
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Published in Simulation modelling practice and theory (01.04.2020)
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A framework for inspection of dies attachment on PCB utilizing machine learning techniques
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Published in Journal of management analytics (03.04.2018)
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GaN-on-Si Thermoresistive Flow Sensor with Gold Hot-wire
Jones, G. Rhys, Gardner, Julian W., Vincent, Timothy, De Luca, Andrea, Longobardi, Giorgia, Eblabla, Abdalla, Elgaid, Khaled, Wotherspoon, Tracy, Birch, Richard, Udrea, Florin
Published in 2019 IEEE SENSORS (01.10.2019)
Published in 2019 IEEE SENSORS (01.10.2019)
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Conference Proceeding
Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans
Dimitriou, Nikolaos, Leontaris, Lampros, Vafeiadis, Thanasis, Ioannidis, Dimosthenis, Wotherspoon, Tracy, Tinker, Gregory, Tzovaras, Dimitrios
Published in arXiv.org (25.02.2020)
Published in arXiv.org (25.02.2020)
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A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics
Dimitriou, Nikolaos, Leontaris, Lampros, Vafeiadis, Thanasis, Ioannidis, Dimosthenis, Wotherspoon, Tracy, Tinker, Gregory, Tzovaras, Dimitrios
Published in arXiv.org (25.02.2020)
Published in arXiv.org (25.02.2020)
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