SOI FinFET nFET-to-pFET Tracking Variability Compact Modeling and Impact on Latch Timing
Jie Deng, Rahman, Ardasheir, Thoma, Rainer, Schneider, Peter W., Johnson, Jim, Trombley, Henry, Ning Lu, Williams, Richard Q., Nayfeh, Hasan M., Kai Zhao, Robison, Russ, Ximeng Guan, Zamdmer, Noah, Shuma, Steve, Worth, Brian, Sundquist, James E., Foreman, Eric A., Springer, Scott K., Wachnik, Rick
Published in IEEE transactions on electron devices (01.06.2015)
Published in IEEE transactions on electron devices (01.06.2015)
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