Variable-wavelength frequency-domain terahertz ellipsometry
Hofmann, T, Herzinger, C M, Boosalis, A, Tiwald, T E, Woollam, J A, Schubert, M
Published in Review of scientific instruments (01.02.2010)
Published in Review of scientific instruments (01.02.2010)
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Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect
Kühne, P, Darakchieva, V, Yakimova, R, Tedesco, J D, Myers-Ward, R L, Eddy, Jr, C R, Gaskill, D K, Herzinger, C M, Woollam, J A, Schubert, M, Hofmann, T
Published in Physical review letters (16.08.2013)
Published in Physical review letters (16.08.2013)
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Journal Article
Terahertz ellipsometry and terahertz optical-Hall effect
Hofmann, T., Herzinger, C.M., Tedesco, J.L., Gaskill, D.K., Woollam, J.A., Schubert, M.
Published in Thin solid films (28.02.2011)
Published in Thin solid films (28.02.2011)
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Conference Proceeding
Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation
Herzinger, C. M., Johs, B., McGahan, W. A., Woollam, J. A., Paulson, W.
Published in Journal of applied physics (15.03.1998)
Published in Journal of applied physics (15.03.1998)
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Journal Article
Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry
Franke, Eva, Trimble, C. L., DeVries, M. J., Woollam, J. A., Schubert, M., Frost, F.
Published in Journal of applied physics (01.11.2000)
Published in Journal of applied physics (01.11.2000)
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Journal Article
Physical and chemical properties of sputter-deposited TaCxNy films
Aouadi, S M, Zhang, Y, Basnyat, P, Stadler, S, Filip, P, Williams, M, Hilfiker, J N, Singh, N, Woollam, J A
Published in Journal of physics. Condensed matter (15.02.2006)
Published in Journal of physics. Condensed matter (15.02.2006)
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Journal Article
UV–vis–infrared optical and AFM study of spin-cast chitosan films
Nosal, W.H., Thompson, D.W., Yan, L., Sarkar, S., Subramanian, A., Woollam, J.A.
Published in Colloids and surfaces, B, Biointerfaces (10.07.2005)
Published in Colloids and surfaces, B, Biointerfaces (10.07.2005)
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Journal Article
Isotropic dielectric functions of highly disordered AlxGa1−xInP (0⩽x⩽1) lattice matched to GaAs
Schubert, M., Woollam, J. A., Leibiger, G., Rheinländer, B., Pietzonka, I., Saß, T., Gottschalch, V.
Published in Journal of applied physics (15.08.1999)
Published in Journal of applied physics (15.08.1999)
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Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells
SAENGER, M. F, SUN, J, SCHÄDEL, M, HILFIKER, J, SCHUBERT, M, WOOLLAM, J. A
Published in Thin solid films (31.01.2010)
Published in Thin solid films (31.01.2010)
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Infrared optical properties of aged porous GaAs
Zangooie, S., Schubert, M., Tiwald, T. E., Woollam, J. A.
Published in Journal of materials research (01.05.2001)
Published in Journal of materials research (01.05.2001)
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Journal Article
Effects of ion concentration on refractive indices of fluids measured by the minimum deviation technique
Berlind, T., Pribil, G. K., Thompson, D., Woollam, J. A., Arwin, H.
Published in Physica status solidi. C (01.05.2008)
Published in Physica status solidi. C (01.05.2008)
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Journal Article
Infrared Ellipsometry - a Novel Tool for Characterization of Group-III Nitride Heterostructures for Optoelectronic Device Applications
Schubert, M., Kasic, A., Einfeldt, S., Hommel, D., Köhler, U., As, D.J., Off, J., Kuhn, B., Scholz, F., Woollam, J.A.
Published in Physica status solidi. B. Basic research (01.11.2001)
Published in Physica status solidi. B. Basic research (01.11.2001)
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Conference Proceeding