Optimized Built-In Self-Repair for Multiple Memories
Kang, Wooheon, Lee, Changwook, Lim, Hyunyul, Kang, Sungho
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2016)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2016)
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Journal Article
A New Accelerated Endurance Test for Terabit NAND Flash Memory Using Interference Effect
Jaewon Cha, Wooheon Kang, Junsub Chung, Kunwoo Park, Sungho Kang
Published in IEEE transactions on semiconductor manufacturing (01.08.2015)
Published in IEEE transactions on semiconductor manufacturing (01.08.2015)
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Journal Article
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories
Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang
Published in 2013 22nd Asian Test Symposium (01.11.2013)
Published in 2013 22nd Asian Test Symposium (01.11.2013)
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Conference Proceeding
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories
Kang, Wooheon, Lee, Changwook, Lim, Hyunyul, Kang, Sungho
Published in IEEE transactions on reliability (01.06.2015)
Published in IEEE transactions on reliability (01.06.2015)
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Journal Article
Scan cell reordering algorithm for low power consumption during scan-based testing
Wooheon Kang, Hyunyul Lim, Sungho Kang
Published in 2014 International SoC Design Conference (ISOCC) (01.11.2014)
Published in 2014 International SoC Design Conference (ISOCC) (01.11.2014)
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Conference Proceeding
Low power scan bypass technique with test data reduction
Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)
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Conference Proceeding
Fail Memory Configuration Set for RA Estimation
Lee, Hayoung, Cho, Keewon, Kang, Sungho, Kang, Wooheon, Lee, Seungtaek, Jeong, Woosik
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Enhenced redundancy analysis for memories using geometric faults based search tree
Wooheon Kang, Hyungjun Cho, Sungho Kang
Published in 2010 International SoC Design Conference (01.11.2010)
Published in 2010 International SoC Design Conference (01.11.2010)
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Conference Proceeding