Generalized electrical substitution methods and detectors for absolute optical power measurements
Woods, S I, Neira, J E, Proctor, J E, Rice, J P, Tomlin, N A, White, M G, Stephens, M S, Lehman, J H
Published in Metrologia (01.08.2022)
Published in Metrologia (01.08.2022)
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Journal Article
Advances in scanning SQUID microscopy for die-level and package-level fault isolation
Knauss, L.A., Orozco, A., Woods, S.I., Cawthorne, A.B.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
Stability and uniformity of planar high temperature Josephson junctions fabricated using nanolithography and ion damage
Katz, A.S., Woods, S.I., Dynes, R.C., Sun, A.G.
Published in IEEE transactions on applied superconductivity (01.06.1999)
Published in IEEE transactions on applied superconductivity (01.06.1999)
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Journal Article
Conference Proceeding
Investigation of Nd-Ce-Cu-O planar tunnel junctions and bicrystal grain boundary junctions
Woods, S.I., Katz, A.S., Kirk, T.L., de Andrade, M.C., Maple, M.B., Dynes, R.C.
Published in IEEE transactions on applied superconductivity (01.06.1999)
Published in IEEE transactions on applied superconductivity (01.06.1999)
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Journal Article
Conference Proceeding
Advances in magnetic-based current imaging for high resistance defects and sub-micron resolution
Knauss, L.A., Orozco, A., Woods, S.I.
Published in Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) (2004)
Published in Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) (2004)
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Conference Proceeding