Unified theory of reverse blocking dynamics in high-voltage cascode devices
Roig, Jaume, Bauwens, Filip, Banerjee, Abhishek, Woochul Jeon, Young, Alexander, McDonald, Jason, Padmanabhan, Balaji, Liu, Charlie
Published in 2015 IEEE Applied Power Electronics Conference and Exposition (APEC) (01.03.2015)
Published in 2015 IEEE Applied Power Electronics Conference and Exposition (APEC) (01.03.2015)
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Conference Proceeding
First experimental demonstration of solid state circuit breaker (SSCB) using 650V GaN-based monolithic bidirectional switch
Shen, Z. John, Zhenyu Miao, Roshandeh, Aref M., Moens, Peter, Devleeschouwer, Herbert, Salih, Ali, Padmanabhan, Balaji, Woochul Jeon
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
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Conference Proceeding
Journal Article
1kV AlGaN/GaN power SBDs with reduced on resistances
Kiyeol Park, Younghwan Park, Shinwhan Hwang, Woochul Jeon, Junghee Lee
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)
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Conference Proceeding
High threshold voltage p-GaN gate power devices on 200 mm Si
Jongseob Kim, Sun-Kyu Hwang, Injun Hwang, Hyoji Choi, Soogine Chong, Hyun-Sik Choi, Woochul Jeon, Hyuk Soon Choi, Jun Yong Kim, Young Hwan Park, Kyung Yeon Kim, Jong-Bong Park, Jong-Bong Ha, Ki Yeol Park, Jaejoon Oh, Jai Kwang Shin, U-In Chung, In-Kyeong Yoo, Kinam Kim
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
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Conference Proceeding
CMOS Schottky diodes for photo-detector and thermal-detector applications
Ji-Hun Han, Woochul Jeon, Melngailis, J.
Published in 2006 5th IEEE Conference on Sensors (01.10.2006)
Published in 2006 5th IEEE Conference on Sensors (01.10.2006)
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Conference Proceeding
Estimation of Short Circuit Capability of GaN HEMTs Using Transient Measurement
Hwang, Injun, Chong, Soogine, Shin, Dong-Chul, Hwang, Sun-Kyu, Park, Younghwan, Kim, Boram, Kim, Joonyong, Oh, Jaejoon, Park, Jun Hyuk, Yu, Min Chul, Jeon, Woochul, Shin, Jai Kwang, Kim, Jongseob
Published in IEEE electron device letters (01.08.2021)
Published in IEEE electron device letters (01.08.2021)
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Journal Article
CMOS and post-CMOS on-chip microwave pulse power detectors
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Journal Article
Conference Proceeding
(Invited) Intrinsic Reliability Assessment of 650V Rated AlGaN/GaN Based Power Devices: An Industry Perspective
Moens, Peter, Banerjee, Abhishek, Constant, Aurore, Coppens, Peter, Caesar, Markus, Li, Zilan, Vandeweghe, Steven, Declercq, Frederick, Padmanabhan, Balaji, Jeon, Woochul, Guo, Jia, Salih, Ali, Tack, Marnix, Meneghini, Matteo, Dalcanale, Stefano, Tajilli, A, Meneghesso, Gaudenzio, Zanoni, Enrico, Uren, Mike, Chatterjee, Indranil, Karboyan, Serge, Kuball, Martin
Published in ECS transactions (04.05.2016)
Published in ECS transactions (04.05.2016)
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Journal Article