by Eddahech, A., Briat, O., Woirgard, E., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2012)

by Lajnef, W., Vinassa, J.-M., Briat, O., Azzopardi, S., Woirgard, E.
Published in Journal of power sources (01.06.2007)

by El Brouji, E.-H., Briat, O., Vinassa, J.-M., Bertrand, N., Woirgard, E.
Published in IEEE transactions on vehicular technology (01.10.2009)

by Le Henaff, F., Azzopardi, S., Deletage, J.Y., Woirgard, E., Bontemps, S., Joguet, J.
Published in Microelectronics and reliability (01.09.2012)

by Youssef, T., Rmili, W., Woirgard, E., Azzopardi, S., Vivet, N., Martineau, D., Meuret, R., Le Quilliec, G., Richard, C.
Published in Microelectronics and reliability (01.08.2015)

by Arabi, F., Theolier, L., Martineau, D., Deletage, J.-Y., Medina, M., Woirgard, E.
Published in Microelectronics and reliability (01.09.2016)

by BRIAT, O, VINASSA, J. M, LAJNEF, W, AZZOPARDI, S, WOIRGARD, E
Published in IET electric power applications (01.09.2007)

by Eddahech, A., Briat, O., Henry, H., Delétage, J.-Y., Woirgard, E., Vinassa, J.-M.
Published in Microelectronics and reliability (01.09.2011)

by Chaari, R., Briat, O., Delétage, J.Y., Woirgard, E., Vinassa, J.-M.
Published in Microelectronics and reliability (01.09.2011)

by Briat, O., Vinassa, J.-M., Bertrand, N., El Brouji, H., Delétage, J.-Y., Woirgard, E.
Published in Microelectronics and reliability (01.09.2010)

by El Brouji, H., Briat, O., Vinassa, J.-M., Bertrand, N., Woirgard, E.
Published in Microelectronics and reliability (01.08.2008)

by Baccar, F., Azzopardi, S., Theolier, L., El Boubkari, K., Deletage, J-Y., Woirgard, E.
Published in Microelectronics and reliability (01.09.2013)

by El Brouji, H., Briat, O., Vinassa, J-M., Henry, H., Woirgard, E.
Published in Microelectronics and reliability (01.09.2009)

by Benmansour, A., Azzopardi, S., Martin, J.C., Woirgard, E.
Published in Microelectronics and reliability (01.09.2006)

by LAJNEF, W, VINASSA, J.-M, BRIAT, O, EL BROUJI, H, AZZOPARDI, S, WOIRGARD, E
Published in IET electric power applications (01.09.2007)

by Micol, A., Zeanh, A., Lhommeau, T., Azzopardi, S., Woirgard, E., Dalverny, O., Karama, M.
Published in Microelectronics and reliability (01.09.2009)

by Loche-Moinet, F., Theolier, L., Woirgard, E.
Published in 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (25.04.2022)

by Belmehdi, Y., Azzopardi, S., Benmansour, A., Delétage, J.-Y., Woirgard, E.
Published in Microelectronics and reliability (01.09.2009)

by Azzopardi, S., Benmansour, A., Ishiko, M., Woirgard, E.
Published in Microelectronics and reliability (01.09.2005)

by Benmansour, A., Azzopardi, S., Martin, J.C., Woirgard, E.
Published in Microelectronics and reliability (01.09.2007)