A Fine-Line nMOS IC for Raster-Scan Control of a 500-MHz Electron-Beam Deflection System
Bayruns, R.J., Suciu, P.I., Wittwer, N.C., Fraser, D.L., Fuls, E.N., Kushner, R.A., Ashley, F.R., Gere, E.A.
Published in IEEE journal of solid-state circuits (01.04.1982)
Published in IEEE journal of solid-state circuits (01.04.1982)
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Journal Article
A fine-line nMOS IC for raster-scan control of a 500-MHz electron-beam deflection system
Bayruns, R.J., Suciu, P.I., Wittwer, N.C., Fraser, D.L., Fuls, E.N., Kushner, R.A., Ashley, F.R., Gere, E.A.
Published in IEEE transactions on electron devices (01.04.1982)
Published in IEEE transactions on electron devices (01.04.1982)
Get full text
Journal Article