Structural and functional test of IBM System z10 chips
Salem, G, Wittig, D W, Foote, T G, Robbins, B J, Hirko, C, lenza, D O, Motika, F, Kyle, J A, Kusko, M P, lenza, O P, Frishmuth, R J, Yaari, R, Michnowski, S, Baur, U
Published in IBM journal of research and development (01.01.2009)
Published in IBM journal of research and development (01.01.2009)
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