Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics
Vidor, F.F., Wirth, G.I., Hilleringmann, U.
Published in Microelectronics and reliability (01.12.2014)
Published in Microelectronics and reliability (01.12.2014)
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Journal Article
Accurate and computer efficient modelling of single event transients in CMOS circuits
WIRTH, G. I, VIEIRA, M. G, LIMA KASTENSMIDT, F. G
Published in IET circuits, devices & systems (01.04.2007)
Published in IET circuits, devices & systems (01.04.2007)
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Journal Article
Three-dimensional quantum-corrected Monte Carlo device simulator of n-FinFETs
Soares, C. S., Furtado, G. F., Rossetto, A. C. J., Wirth, G. I., Vasileska, D.
Published in Journal of computational electronics (01.04.2024)
Published in Journal of computational electronics (01.04.2024)
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Journal Article
Response of a single trap to AC negative Bias Temperature stress
Toledano-Luque, M, Kaczer, B, Roussel, P J, Grasser, T, Wirth, G I, Franco, J, Vrancken, C, Horiguchi, N, Groeseneken, G
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Modeling of statistical low-frequency noise of deep-submicrometer MOSFETs
Wirth, G.I., Jeongwook Koh, da Silva, R., Thewes, R., Brederlow, R.
Published in IEEE transactions on electron devices (01.07.2005)
Published in IEEE transactions on electron devices (01.07.2005)
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Journal Article
Statistical Model for MOSFET Bias Temperature Instability Component Due to Charge Trapping
Wirth, G. I., da Silva, R., Kaczer, B.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
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Journal Article
TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation
Kastensmidt, F. L., Fonseca, E. C. P., Vaz, R. G., Goncalez, O. L., Chipana, R., Wirth, G. I.
Published in IEEE transactions on nuclear science (01.08.2011)
Published in IEEE transactions on nuclear science (01.08.2011)
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Journal Article
Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors
Vidor, Fábio Fedrizzi, Wirth, Gilson Inácio, Wolff, Karsten, Hilleringmann, Ulrich
Published in ECS transactions (01.01.2011)
Published in ECS transactions (01.01.2011)
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Journal Article
Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits
Brusamarello, L., da Silva, R., Wirth, G.I., Reis, R.A.L.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.09.2008)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.09.2008)
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Journal Article
On-chip circuit for massively parallel BTI characterization
da Silva, M. B., Kaczer, B., Van der Plas, G., Wirth, G. I., Groeseneken, G.
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)
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Conference Proceeding
Analysis of Total Ionizing Dose Effects on a Pseudo-Static Random Access Memory (PSRAM)
Both, T. H., Wirth, Gilson I., Pereira Junior, E. C. F., Gonçalez, O. L., Vaz, R. G., Pereira, M. A., Milagres, D. C.
Published in ECS transactions (01.01.2012)
Published in ECS transactions (01.01.2012)
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Journal Article
A TCAD evaluation of a single Bulk-BICS with integrative memory cell
Simionovski, A., Wirth, G.I., Schrimpf, R.D., Bhuva, B.L.
Published in Microelectronics (01.10.2018)
Published in Microelectronics (01.10.2018)
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Journal Article
Recent trends in CMOS reliability: From individual traps to circuit simulations
Kaczer, B., Toledano-Luque, M., Franco, J., Grasser, T., Roussel, J., Camargo, V. V. A., Mahato, S., Simoen, E., Catthoor, F., Wirth, G. I., Groeseneken, G.
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)
Published in 2011 IEEE International Integrated Reliability Workshop Final Report (01.10.2011)
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Conference Proceeding
Digital Circuit Design Based on the Resonant-Tunneling-Hetero-Junction-Bipolar-Transistor
Glosekotter, P., Pacha, C., Goser, K. F., Wirth, G. I., Prost, W., Auer, U., Agethen, M., Velling, P., Tegude, F. J.
Published in Proceedings of the 13th symposium on Integrated circuits and systems design (18.09.2000)
Published in Proceedings of the 13th symposium on Integrated circuits and systems design (18.09.2000)
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Conference Proceeding
Self-aligned ZnO nanoparticle-based TFTs for flexible electronics
Vidor, F. F., Wirth, G. I., Meyers, T., Reker, J., Hilleringmann, U.
Published in 2017 IEEE AFRICON (01.09.2017)
Published in 2017 IEEE AFRICON (01.09.2017)
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Conference Proceeding
Device degradation and resilient computing
Glosekotter, Peter, Greveler, Ulrich, Wirth, Gilson I.
Published in 2008 IEEE International Symposium on Circuits and Systems (01.01.2008)
Published in 2008 IEEE International Symposium on Circuits and Systems (01.01.2008)
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Conference Proceeding
Journal Article
"The flipped voltage follower"-based low voltage fully differential CMOS sample-and-hold circuit
Fayomi, Christian Jesus B., Wirth, Gilson I., Ramirez-Angulo, Jamine, Matsuzawa, Akira
Published in 2008 IEEE International Symposium on Circuits and Systems (01.01.2008)
Published in 2008 IEEE International Symposium on Circuits and Systems (01.01.2008)
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Conference Proceeding
Journal Article
A Bulk Built-in Current Sensor for SET detection with dynamic memory cell
Simionovski, A., Wirth, G. I.
Published in 2012 IEEE 3rd Latin American Symposium on Circuits and Systems (LASCAS) (01.02.2012)
Published in 2012 IEEE 3rd Latin American Symposium on Circuits and Systems (LASCAS) (01.02.2012)
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Conference Proceeding