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A plastic packaged 10 Gb/s BiCMOS clock and data recovering 1:4-demultiplexer with external VCO
by
Hauenschild, J.
,
Dorschky, C.
,
Winkler vonMohrenfels
,
T
.
,
Seitz, R.
Published in
IEEE journal of solid-state circuits
(01.12.1996)
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Journal Article
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engineering
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bicmos integrated circuits
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circuit testing
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clocks
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degradation
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detectors
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IEEE/IET Electronic Library (IEL)
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