Accurate and traceable measurement of nano- and microstructures
Dai, Gaoliang, Pohlenz, Frank, Xu, Min, Koenders, Ludger, Danzebrink, Hans-Ulrich, Wilkening, Günter
Published in Measurement science & technology (01.03.2006)
Published in Measurement science & technology (01.03.2006)
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Journal Article
Entwicklung einer Kalibrierrichtlinie für Rastersondenmikroskope (Development of a Calibration Guideline for Scanning Probe Microscopes)
Dziomba, Thorsten, Koenders, Ludger, Wilkening, Günter, Flemming, Marcel, Duparré, Angela
Published in Technisches Messen (01.05.2005)
Published in Technisches Messen (01.05.2005)
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Journal Article
Accurate and traceable measurement of nano- and microstructures
Dai, Gaoliang, Pohlenz, Frank, Xu, Min, Koenders, Ludger, Danzebrink, Hans-Ulrich, Wilkening, Gunter
Published in Measurement science & technology (01.03.2006)
Published in Measurement science & technology (01.03.2006)
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Journal Article
Transmission scanning near-field optical microscopy with uncoated silicon tips
Danzebrink, Hans U., Castiaux, Annick, Girard, Christian, Bouju, Xavier, Wilkening, Günter
Published in Ultramicroscopy (01.03.1998)
Published in Ultramicroscopy (01.03.1998)
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Journal Article
Conference Proceeding
Dimensionelle Metrologie mittels Rastersondenmikroskopie (Dimensional Metrology based on Scanning Probe Microscopy)
Herrmann, K., Koenders, Ludger, Danzebrink, H.-U., Hasche, Klaus, Wilkening, Günter, Pohlenz, F., Kuetgens, U., Mirandé, W., Yacoot, A.
Published in Technisches Messen (01.12.2002)
Published in Technisches Messen (01.12.2002)
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Journal Article