Multireflection grazing incidence diffraction used for stress measurementsin surface layers
Marciszko, Marianna, Baczmanski, Andrzej, Wrobel, Miroslaw, Seiler, Wilfried, Braham, Chedly, Donges, Jörn, Sniechowski, Maciej Iek, Wierzbanowskia, Krzysztof
Published in Thin solid films (2013)
Published in Thin solid films (2013)
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