Real-time imaging of microparticles and living cells with CMOS nanocapacitor arrays
Laborde, C., Pittino, F., Verhoeven, H. A., Lemay, S. G., Selmi, L., Jongsma, M. A., Widdershoven, F. P.
Published in Nature nanotechnology (01.09.2015)
Published in Nature nanotechnology (01.09.2015)
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Journal Article
Closed- and open-boundary models for gate-current calculation in n-MOSFETs
Dalla Serra, A., Abramo, A., Palestri, P., Selmi, L., Widdershoven, F.
Published in IEEE transactions on electron devices (01.08.2001)
Published in IEEE transactions on electron devices (01.08.2001)
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Journal Article
Gate-stack analysis for 45-nm CMOS devices from an RF perspective
Nuttinck, S., Curatola, G., Widdershoven, F.
Published in IEEE transactions on electron devices (01.04.2006)
Published in IEEE transactions on electron devices (01.04.2006)
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Journal Article
Explanation of SILC Probability Density Distributions With Nonuniform Generation of Traps in the Tunnel Oxide of Flash Memory Arrays
Vianello, E., Driussi, F., Esseni, D., Selmi, L., Widdershoven, F., van Duuren, M.J.
Published in IEEE transactions on electron devices (01.08.2007)
Published in IEEE transactions on electron devices (01.08.2007)
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Journal Article
Examination of the Si(111)-SiO2, Si(110)-SiO2, and Si(100)-SiO2 interfacial properties following rapid thermal annealing
HURLEY, P. K, O'SULLIVAN, B. J, CUBAYNES, F. N, STOLK, P. A, WIDDERSHOVEN, F. P, DAS, J. H
Published in Journal of the Electrochemical Society (01.03.2002)
Published in Journal of the Electrochemical Society (01.03.2002)
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Journal Article
Modeling statistical dopant fluctuations in MOS transistors
Stolk, P.A., Widdershoven, F.P., Klaassen, D.B.M.
Published in IEEE transactions on electron devices (01.09.1998)
Published in IEEE transactions on electron devices (01.09.1998)
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Journal Article
Experimental characterization of statistically independent defects in gate dielectrics-part II: experimental results on flash memory arrays
Driussi, F., Widdershoven, F., Esseni, D., Selmi, L., van Duuren, M.J.
Published in IEEE transactions on electron devices (01.05.2005)
Published in IEEE transactions on electron devices (01.05.2005)
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Journal Article
Flat band voltage shift and oxide properties after rapid thermal annealing
O'Sullivan, B.J., Hurley, P.K., Cubaynes, F.N., Stolk, P.A., Widdershoven, F.P.
Published in Microelectronics and reliability (01.07.2001)
Published in Microelectronics and reliability (01.07.2001)
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Journal Article
Correction to "A comparative analysis of substrate current generation mechanisms in tunneling mos capacitors"
Palestri, P., Serra, A.D., Selmi, L., Pavesi, M., Rigolli, P.L., Abramo, A., Widdershoven, F., Sangiorgi, E.
Published in IEEE transactions on electron devices (01.10.2002)
Published in IEEE transactions on electron devices (01.10.2002)
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Journal Article
Extraction of gate oxide thickness from C– V measurements
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Journal Article
Conference Proceeding
Examination of the Si(111)-SiO[sub 2], Si(110)-SiO[sub 2], and Si(100)-SiO[sub 2] Interfacial Properties Following Rapid Thermal Annealing
Hurley, P. K., O’Sullivan, B. J., Cubaynes, F. N., Stolk, P. A., Widdershoven, F. P., Das, J. H.
Published in Journal of the Electrochemical Society (2002)
Published in Journal of the Electrochemical Society (2002)
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Journal Article
Elimination of accumulation charge effects for high-resistive silicon substrates
Jansman, A.B.M., van Beek, J.T.M., van Delden, M.H.W.M., Kemmeren, A.L.A.M., den Dekker, A., Widdershoven, F.P.
Published in ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003 (2003)
Published in ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003 (2003)
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Conference Proceeding
CMOS biosensor platform
Widdershoven, F, Van Steenwinckel, D, Überfeld, J, Merelle, T, Suy, H, Jedema, F, Hoofman, R, Tak, C, Sedzin, A, Cobelens, B, Sterckx, E, van der Werf, R, Verheyden, K, Kengen, M, Swartjes, F, Frederix, F
Published in 2010 International Electron Devices Meeting (01.12.2010)
Published in 2010 International Electron Devices Meeting (01.12.2010)
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Conference Proceeding
Impact ionization and photon emission in MOS capacitors and FETs
Palestri, P., Pavesi, M., Rigolli, P., Selmi, L., Dalla Serra, A., Abramo, A., Widdershoven, F., Sangiorgi, E.
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
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Conference Proceeding