Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectron spectroscopy
Smekal, Werner, Werner, Wolfgang S. M., Powell, Cedric J.
Published in Surface and interface analysis (01.11.2005)
Published in Surface and interface analysis (01.11.2005)
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Conference Proceeding
Energy Dissipation of Fast Electrons in Polymethylmethacrylate: Toward a Universal Curve for Electron-Beam Attenuation in Solids between ∼0 eV and Relativistic Energies
Werner, Wolfgang S M, Simperl, Florian, Blödorn, Felix, Brunner, Julian, Kero, Johannes, Bellissimo, Alessandra, Ridzel, Olga
Published in Physical review letters (03.05.2024)
Published in Physical review letters (03.05.2024)
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Journal Article
Emission-depth-selective auger photoelectron coincidence spectroscopy
Werner, Wolfgang S M, Smekal, Werner, Störi, Herbert, Winter, Hannspeter, Stefani, Giovanni, Ruocco, Alessandro, Offi, Francesco, Gotter, Roberto, Morgante, Alberto, Tommasini, Fernando
Published in Physical review letters (28.01.2005)
Published in Physical review letters (28.01.2005)
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Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S M, Mikmeková, Eliška Materna
Published in Nanomaterials (Basel, Switzerland) (18.09.2021)
Published in Nanomaterials (Basel, Switzerland) (18.09.2021)
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Effect of surface roughness on angle-resolved XPS
Katona, L., Bianchi, D., Brenner, J., Vorlaufer, G., Vernes, A., Betz, G., Werner, W. S. M.
Published in Surface and interface analysis (01.08.2012)
Published in Surface and interface analysis (01.08.2012)
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Conference Proceeding